Driving time sequence control method of CMOS detector

A technology of driving timing and control method, which is applied in the parts of color TV, parts of TV system, TV, etc., can solve the problems of blurred image, abnormal working state, etc., achieve normal working state, improve stability and reliability. The effect of reliability

Active Publication Date: 2021-07-20
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The present invention provides a driving sequence control method for a CMOS detector in order to solve the problem that the existing CMOS detector is prone to abnormal working conditions, resulting in blurred images, etc.

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  • Driving time sequence control method of CMOS detector
  • Driving time sequence control method of CMOS detector
  • Driving time sequence control method of CMOS detector

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Embodiment Construction

[0020] combine Figure 1 to Figure 5 Describe this implementation mode, a driving sequence control method of a CMOS detector, which is implemented based on a CMOS imaging system, such as figure 1 As shown, the CMOS imaging system mainly includes power conversion circuits, imaging detectors, drive and control circuits, imaging controllers, data transmission interface circuits, memory and control interface circuits. The power conversion circuit provides power supply for each part; the external input control communication signal is sent to the imaging controller through the control interface circuit; the driving and control signal generated by the imaging controller is sent to the imaging detector after passing through the driving and control circuit; The non-uniform correction coefficient is stored in the memory; the digital image data output by the imaging detector is conditioned by the imaging controller and then output through the digital transmission interface circuit.

[0...

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Abstract

A driving time sequence control method of a CMOS detector relates to the technical field of CMOS detector imaging control, solves the problems of image blurring and the like caused by the fact that the working state of an existing CMOS detector is easy to be abnormal, and an imaging controller comprises a power-on time sequence and SPI module, a training module, a data conditioning module, a driving time sequence module, a 422 communication and analysis module and a data transmission module. The power-on time sequence and SPI module is composed of a counter and a D trigger in a homologous clock domain. According to the driving time sequence control method, based on optimal driving time sequence signal position setting of training, it is guaranteed that the detector is located at a stable and reliable position when sampling signals in the detector, the working state is normal, and the phenomenon of instability caused by changes of the external environment such as the temperature is avoided. The time sequence reset signal is re-sampled and then output, the relatively constant phase relation between the time sequence reset signal and each driving control signal is ensured, the sampling metastable state in the detector is avoided, and therefore the application stability and reliability can be improved.

Description

technical field [0001] The invention relates to a driving sequence control method of a CMOS detector, in particular to a driving sequence control method of a CMOS detector applied by inputting a high-frequency differential clock. Background technique [0002] The CMOS detector needs to provide a reference clock from the outside first. In order to avoid the abnormal working state of the phase-locked loop (PLL) and affect the reliability, a high-frequency clock can be directly input. In order to control the working mode of the detector, the content of the internal SPI register is usually configured. In order to save configuration time, the SPI reading and writing frequency is usually set higher; in order to realize the normal operation of the detector, it is necessary to input multiple A driving and control signal; in addition, in the power-on and reset stages of the detector, it is also necessary to output a power-on reset signal and a timing reset signal. If the transition ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/374
CPCH04N25/76
Inventor 余达韩诚山薛栋林姜肖楠张博研张艳鹏李俊霖
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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