Taiko ring removal method and positioning device for removing Taiko ring
A positioning device and Taiko technology, applied in the direction of fine working devices, stone processing equipment, laser welding equipment, etc., can solve the problems of wafer breakage and inaccurate positioning, and achieve the effect of reducing the risk of damage and accurate positioning
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Embodiment 1
[0029] Embodiment 1 is Taiko ring removal method
[0030] figure 1 It is a schematic diagram of the steps of the Taiko ring removal method of the present embodiment
[0031] In step S1, the wafer 1 is processed and thinned by the Taiko process, and the middle part of the wafer 1 is thinned to a preset thickness, and the edge part of the wafer 1 is not thinned to form a Taiko ring 2 .
[0032] Step S2, sticking the dicing film 3 on the non-thinning surface of the wafer 1, and fixing the wafer 1 to the frame 4, as figure 2 shown.
[0033] The diameter of the dicing film 3 is larger than that of the wafer 1 . The cut film 3 is in surface contact with the frame 4 .
[0034] Frame 4 is usually made of stainless steel, and its shape can be as figure 1 As shown, the periphery is slightly larger than the dicing film 3 , which can be used as a fixing part for cutting the taiko ring 2 , and can also be packaged with the wafer 1 later as a structural member for protecting the wafer...
Embodiment 2
[0048] Example 2 is a positioning device for Taiko ring removal
[0049] The positioning device includes a camera, a control unit, and a mobile unit. The camera is used to take pictures of designated positions of the wafer, such as taking pictures of the edge of the wafer. In this embodiment, 4 cameras are provided to take pictures of 4 wafer edges at the same time. Four cameras are only one implementation mode, and three cameras can also be used to realize positioning. Of course, more cameras, for example, six cameras can be used to achieve higher positioning accuracy.
[0050] The control unit is used to obtain photo information, calculate the positioning deviation of the wafer, and control the movement of the mobile unit. After the control unit obtains the photo information, it calculates the center position A of the current wafer through the analysis and calculation of the edge position in the photo, and then calculates the deviation from the preset center position B requ...
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