Test system for superconducting single-flux quantum circuits
A quantum circuit and test system technology, applied in the direction of electronic circuit test, superconductor element usage, etc., can solve the problems of large-scale chip selection circuit and complicated test steps, and achieve the effect of small scale
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Embodiment 1
[0103] like figure 1 and figure 2 As shown, this embodiment provides a test system for a superconducting single magnetic flux subcircuit, and the test system for a superconducting single magnetic flux subcircuit includes:
[0104] The circuit to be tested 2 and at least one chip selection circuit 3 , each of the chip selection circuits 3 and the circuit to be tested 2 are disposed on the same chip 1 .
[0105] like figure 2 As shown, the chip selection circuit 3 receives an input signal, a bias signal, and outputs an output signal, and determines the quality of the current chip based on the test results of each chip selection circuit 3 .
[0106] Specifically, in this embodiment, the chip selection circuit 3 includes a first interface module 3a, a Josephson junction transmission line module 3b and a second interface module 3c. The first interface module 3a receives the input signal in, and transmits the input signal in to the Josephson junction transmission line module 3b...
Embodiment 2
[0109] like figure 1 , Figure 3-Figure 6 As shown, this embodiment provides a testing system for a superconducting single-flux subcircuit, and the difference from the first embodiment is that the chip selection circuit 3 is based on an XNOR linear feedback shift register structure. Linear Feedback Shift Register (LFSR) can be generally divided into XOR type and XNOR type according to the different feedback logic. For multi-bit XOR type LFSR, the circuit is prohibited. The state is the all-zero state of "00...00". When the circuit is working, it is necessary to input a signal to the circuit to introduce a non-zero state, and then the circuit will be in the state of "00...01" to "11...11" Continuous pseudo-random transformation, thereby outputting a pseudo-random sequence at the output, while the same-or LFSR has a similar function, the difference is that the forbidden state of the same-or LFSR is the all-one state of "11...11", while the initial state of the circuit The "00....
Embodiment 3
[0122] like figure 1 , Figure 7-Figure 15 As shown, this embodiment provides a test system for a superconducting single-flux sub-circuit, which is different from the second embodiment in that the chip selection circuit 3 is a high-frequency-based XNOR linear feedback shift register structure.
[0123] like Figure 7 As shown, the chip selection circuit 3 includes a fifth interface module 3k, a sixth interface module 31, a high-frequency clock generation module 3m (Clock Generator, CG), a fourth trigger 3n, a fifth trigger 3o, a sixth trigger 3p, the second XOR gate 3q, the second inverter 3r and the data sampling down-conversion module 3s.
[0124] Specifically, the fifth interface module 3k receives an input signal in (an example is a clock signal), and transmits the input signal in to the high-frequency clock generation module 3m; as an example, the fifth interface module 3k is DC / SFQ converter, converts DC signal to SFQ signal. The bias signal provides bias current fo...
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