Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Global control method and device for damage and fracture of integral wallboard structure

A technology for overall siding and structural damage, applied in instrumentation, design optimization/simulation, calculations, etc., to solve problems such as poor damage tolerance performance, multiple design and iteration cycles, and costs

Active Publication Date: 2021-09-03
TSINGHUA UNIV +2
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, compared with the traditional riveted siding, the integral siding lacks the natural crack arresting element—the rivet connecting the stringer and the skin, which makes the damage tolerance performance poor. In view of this shortcoming, domestic and foreign scholars and designers Our research focuses on how to improve its damage tolerance performance as much as possible so as to meet the design requirements of aircraft damage tolerance and achieve the goal of safety.
[0003] At present, the main problem in the research and design of the damage and fracture of the overall panel is: only consider the detail control, that is, under the assumption that the global parameters remain unchanged, only the shape and size of the ribs are optimized, which is only the overall panel damage. One aspect of tolerance design, without a global perspective, it is easy to spend more design and iteration cycles

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Global control method and device for damage and fracture of integral wallboard structure
  • Global control method and device for damage and fracture of integral wallboard structure
  • Global control method and device for damage and fracture of integral wallboard structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, only a part of the embodiments of the present invention, not all the embodiments, and are not intended to limit the present invention.

[0072] refer to figure 1 , shows a flow chart of a global control method for damage and fracture of an integral panel structure according to an embodiment of the present invention, the method includes:

[0073] Step S1: Establish the global damage parameter matrix of the overall panel structure.

[0074] In the embodiment of the present invention, the overall situation of the whole wall panel is considered comprehensively, so it is necessary to establish a global loss parameter matr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a global control method and device for damage fracture of an integral panel structure, and relates to the field of aircraft structure damage tolerance design, and the method comprises the steps: building a global damage parameter matrix of the integral panel structure; determining a control constraint; selecting a first group of parameters, and establishing a three-dimensional shell finite element model containing at least three rib integral wallboard structures according to the first group of parameters; simulating a crack propagation track by using a finite element method based on the reinforced area and unit, and obtaining a change curve of the stress intensity factor along with the crack length; according to the change curve, calculating the crack propagation life, the residual strength value and the weight under the first group of parameters; judging whether the crack propagation life, the residual strength value and the weight meet preset conditions or not; and if any one does not meet the preset condition, returning to the step of selecting a second group of parameters. According to the method and device, the crack propagation speed is delayed to the maximum extent, the damage tolerance performance of the whole wallboard is improved, and rapid iteration of optimization design is guaranteed.

Description

technical field [0001] The invention relates to the field of damage tolerance design of aircraft structures, in particular to a global control method and device for damage and fracture of an integral panel structure. Background technique [0002] Due to the advantages of good fatigue performance, simple manufacture and light structure weight, the integral panel has been applied in many medium and large aircraft structures. However, compared with the traditional riveted siding, the integral siding lacks the natural crack arresting element—the rivet connecting the stringer and the skin, which makes the damage tolerance performance poor. In view of this shortcoming, domestic and foreign scholars and designers Our research focuses on how to improve its damage tolerance performance as much as possible so as to meet the design requirements of aircraft damage tolerance and achieve the purpose of safety. [0003] At present, the main problem in the research and design of the damage...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/23G06T17/20G06F119/04
CPCG06F30/23G06T17/20G06F2119/04Y02T90/00
Inventor 庄茁宁宇张志楠王恒柳占立秦剑波
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products