Method for indirectly detecting lattice defects of MLCC dielectric ceramic

A technology for dielectric ceramics and lattice defects is applied in the field of indirect detection of lattice defects in MLCC dielectric ceramics.

Active Publication Date: 2021-10-26
广东微容电子科技有限公司
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Problems solved by technology

[0006] In view of the above problems, this application provides a method for indirect detection of lattice defects in MLCC di

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  • Method for indirectly detecting lattice defects of MLCC dielectric ceramic
  • Method for indirectly detecting lattice defects of MLCC dielectric ceramic

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[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0029] It should be noted that all directional indications in the embodiments of the present application, such as up, down, left, right, front, back... are only used to explain the relative positional relationship between the components in a certain posture as shown in the accompanying drawings, Sports conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0030] In addition, the descriptions involvin...

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Abstract

The invention relates to the field of dielectric ceramic lattice defect detection of ceramic elements and discloses a method for indirectly detecting dielectric ceramic lattice defects of an MLCC. The method comprises the following steps of preparing materials, preparing a test fixture, a high-temperature aging oven, an ampere meter, a universal meter and an insulation tester according to requirements; mounting the to-be-tested products, mounting the to-be-tested products on the test fixture in series; state confirmation, confirming that an installation state of the to-be-tested product is good; adjusting test conditions, putting a to-be-tested product into a high-temperature aging oven, and presetting a test temperature and a test voltage; setting value taking time, setting a current acquisition value taking time interval; starting a test, starting a high-temperature aging oven, and enabling the aging oven to be in a heat preservation state for testing after the temperature reaches a preset value; timing value taking, taking a value of the current of the to-be-tested object according to a preset time interval; and calculating an insulation resistance value at each moment. Through the mode, lattice defects of the MLCC dielectric ceramic can be effectively and indirectly detected, and operation is simple and visual.

Description

technical field [0001] The present application relates to the field of detection of lattice defects in ceramic element dielectrics, in particular to a method for indirect detection of lattice defects in MLCC dielectric ceramics. Background technique [0002] In metal oxides or other oxygen-containing compounds, oxygen atoms (oxygen ions) in the crystal lattice detach, resulting in a loss of oxygen, forming vacancies. Specifically in the field of ceramic components, dielectric ceramic lattice defects refer to the defects left by oxygen ions escaping from the dielectric ceramic lattice. Lattice defects in dielectric ceramics are the most common defects in dielectric ceramic materials of ceramic components, which have an important impact on the performance of dielectric ceramic materials. [0003] In recent years, in order to reduce production costs, MLCC (Multi-layer Ceramic Chip Capacitors) has used BME (Ni / Cu) base metal internal electrode technology to keep BME-MLCC in a n...

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Application Information

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IPC IPC(8): G01R27/02G01R31/00G01N27/04
CPCG01R27/025G01R31/003G01N27/041
Inventor 李茜
Owner 广东微容电子科技有限公司
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