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GOA panel electrostatic damage analysis method, improvement structure and improvement method

A technology of electrostatic damage and analysis method, which is applied in the direction of static electricity, electrical components, static indicators, etc., can solve the problems of gate drive circuit damage and low efficiency, and achieve the effects of reducing the scope, improving efficiency, and enhancing antistatic ability

Pending Publication Date: 2021-10-29
信利(仁寿)高端显示科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Especially for GOA panels, GOA panels are fabricated with gate drive circuits on the peripheral area of ​​the array substrate, which is more likely to cause damage to the gate drive circuits due to frictional static electricity during the PI friction process of the LCD process
In the existing technology, if the gate drive circuit of the GOA panel is damaged, the damage point can only be found bit by bit through optical microscope observation, which is extremely inefficient.

Method used

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  • GOA panel electrostatic damage analysis method, improvement structure and improvement method
  • GOA panel electrostatic damage analysis method, improvement structure and improvement method
  • GOA panel electrostatic damage analysis method, improvement structure and improvement method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Such as figure 1 As shown, an analysis method for electrostatic damage of GOA panels includes the following steps:

[0025] Step 100: The driver lights up the GOA panel to be checked.

[0026] In step 100, the GOA panel to be inspected is placed on a backlight source, and then the backlight source is turned on, and then all sub-pixels on the GOA panel to be inspected are driven to be turned on, so that the GOA panel to be inspected displays a white picture.

[0027] Step 200: According to the defective display on the GOA panel to be checked, determine whether the gate drive circuit on the peripheral area is damaged, and if so, go to step 300.

[0028] In this step 200, if a certain driving unit in the gate driving circuit is damaged, all sub-pixels connected to the Gate line corresponding to the damaged driving unit cannot be opened or are poorly opened. Correspondingly, the GOA panel to be inspected There will be black horizontal lines, partial darkening or partial c...

Embodiment 2

[0050] Such as figure 2As shown, an improved structure of a GOA panel includes a large panel panel, the large panel panel includes a plurality of panel areas 11 and a waste area 12 arranged between adjacent panel areas 11, each panel area 11 corresponds to a GOA The panel is also fabricated with a gate drive circuit 110 ; at least one electrostatic guide line 120 is arranged on the waste area, and each electrostatic guide line 120 is connected to the gate drive circuits 110 in at least two panel areas 11 .

[0051] The improved structure connects the gate drive circuits 110 in each panel area 11 by adding static electricity guide lines 120. When a certain gate drive circuit 110 generates static electricity during the manufacturing process of the GOA panel, the gate drive circuit 110 can be guided by the static electricity. The wire 120 shunts the static electricity to other gate driving circuits 110 to share the static electricity with other gate driving circuits 110 and enha...

Embodiment 3

[0055] Such as image 3 As shown, a method for improving the GOA panel includes the following steps:

[0056] Step 1: making the improved structure of the GOA panel described in Example 2;

[0057] Step 2: cutting the large panel, and peeling off each panel area 11 from the waste area 12 to form a GOA panel.

[0058] After the stripping, the electrostatic guiding lines 120 remain on the waste area 12 , and the gate driving circuits 110 in each GOA panel are no longer connected to each other.

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PUM

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Abstract

The invention discloses a GOA panel electrostatic damage analysis method. The method comprises the following steps: driving and lightening a GOA panel to be detected; according to the condition of poor display on the GOA panel to be detected, determining whether a gate drive circuit on the peripheral area is damaged, and if yes, carrying out the step 300; determining an approximate damaged area of the gate drive circuit in the peripheral area according to the position of poor display on the to-be-detected GOA panel; and amplifying and observing the approximate damaged area of the gate driving circuit to determine the accurate damaged position of the gate driving circuit. According to the analysis method, the efficiency of determining the damage position on the GOA panel can be improved. The invention also discloses a GOA panel improvement structure and an improvement method.

Description

technical field [0001] The invention relates to display production technology, in particular to an analysis method, improved structure and improved method of electrostatic damage to a GOA panel. Background technique [0002] In the LCD manufacturing process, static electricity is a problem that cannot be ignored. At present, the circuit of TFT-LCD is getting finer and finer, and the static electricity of about 200V can damage the circuit. In order to solve the electrostatic injury, companies in the same industry have purchased a large number of various antistatic equipment such as soft X-ray devices and deionization fans. In addition to adding antistatic equipment to remove static electricity, companies in the same industry are also optimizing circuit design to further enhance the antistatic ability of products. [0003] Especially for GOA panels, GOA panels have a gate drive circuit fabricated on the peripheral area of ​​the array substrate, which is more likely to cause ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G02F1/133G02F1/1345G09G3/00G09G3/36H05F3/00
CPCG02F1/1309G02F1/13306G02F1/13452G09G3/006G09G3/36H05F3/00
Inventor 王瑞生刘福知
Owner 信利(仁寿)高端显示科技有限公司