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Simplified measuring device and method for half-wave voltage of optical phase modulator

A half-wave voltage and measuring device technology, which is applied in measuring devices, measuring current/voltage, instruments, etc., can solve the problem of small DC half-wave voltage, achieve half-wave voltage accuracy, simplify measuring devices and methods, and be easy to assemble Effect

Pending Publication Date: 2021-11-02
NO 34 RES INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the DC half-wave voltage measured at this time is too small and can only be used as a reference.

Method used

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  • Simplified measuring device and method for half-wave voltage of optical phase modulator

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Embodiment Construction

[0026] The technical solutions of the present invention will be further described below in conjunction with the embodiments shown in the accompanying drawings.

[0027] Embodiment of the simplified measurement device for the half-wave voltage of the optical phase modulator of the present invention:

[0028] Optical phase modulator half-wave voltage of the present invention simplifies measuring device, comprises the semiconductor laser LD1 of the stable output optical power of the polarization-maintaining optical fiber connected in sequence, optical fiber polarization controller PC2, optical phase modulator PM3 (commercial product) to be tested, optical amplitude Modulator AM4 and optical power meter P5, the RF signal coaxial line is connected to the RF input port of optical phase modulator PM3, such as figure 1 shown.

[0029] When no RF voltage is applied to the optical phase modulator PM3, adjust the two knobs of the optical fiber polarization controller PC2 to make the op...

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Abstract

The invention discloses a simplified measuring device and method for the half-wave voltage of an optical phase modulator. The device comprises a semiconductor laser LD, an optical fiber polarization controller PC, a to-be-tested optical phase modulator PM, an optical amplitude modulator AM, and an optical power meter P. An output optical fiber of the semiconductor laser LD is connected with an input optical fiber of the optical fiber polarization controller PC. An output optical fiber of the optical fiber polarization controller PC is connected with an input polarization maintaining optical fiber of the optical phase modulator PM, an output optical fiber of the optical phase modulator PM is connected with an input polarization maintaining optical fiber of the optical amplitude modulator AM, an output optical fiber of the optical amplitude modulator AM is connected with a probe of the optical power meter P, and a radio frequency input port of the optical phase modulator PM is connected with a radio frequency signal line. Compared with a traditional half-wave voltage testing method, the method can achieve rapid measurement and meet the repetition frequency requirement of practical application, and is simple and convenient to use.

Description

technical field [0001] The invention relates to an optical device testing technology, in particular to a simplified measurement device and method for half-wave voltage of an optical phase modulator. Background technique [0002] At present, the optical phase modulator is an important optical device in the fields of optical fiber communication, wireless optical communication and optical fiber sensing. The light wave passes through the optical phase modulator, and the radio frequency (RF) voltage is loaded on the RF input port of the optical phase modulator. Modulate the phase of the light wave. However, in use, it is often necessary to determine its half-wave voltage, that is, the RF driving voltage that changes the phase of the light wave by half a wavelength (π). [0003] The common methods for traditionally testing the half-wave voltage of optical phase modulators are as follows: figure 2 As shown, it includes semiconductor laser LD1 with stable output optical power of p...

Claims

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Application Information

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IPC IPC(8): G01R19/00
CPCG01R19/00
Inventor 吴国锋张昕赵灏覃波刘志强杨小亮
Owner NO 34 RES INST OF CHINA ELECTRONICS TECH GRP
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