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Scan output flip-flop

A scanning output, trigger technology, applied in the direction of instruments, measuring devices, measuring electricity, etc., can solve problems such as increasing power consumption, and achieve the effect of reducing power consumption

Pending Publication Date: 2021-11-05
MEDIATEK INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, regardless of normal data or scan data transmission, the circuit behind the common output terminal is still running, which will increase unnecessary power consumption

Method used

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  • Scan output flip-flop
  • Scan output flip-flop
  • Scan output flip-flop

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Embodiment Construction

[0017] Certain terms used in the specification and claims to refer to particular components. Those skilled in the art will appreciate, manufacturers may use different terms to refer to a component. This specification and the claims are not as distinguishing components in the name of the name, but as the components are functional as differentiated guidelines. Mentioned throughout the specification and claims, "comprising" and "comprises" is an open-ended fashion, and thus should be interpreted to mean "including, but not limited to." "Substantially" means within an acceptable error range, those skilled in the art to solve the technical problem within a certain error range, to achieve the basic technical effect. In addition, the "couple" is intended to mean any indirect or direct electrical connection. Accordingly, described herein if a device is coupled to a second device, the first device represents directly electrically connected to the second means, or indirectly through other i...

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Abstract

The invention provides a scan output flip-flop for outputting a scan-out signal at a scan output terminal of the scan output flip-flop, comprising: a selection circuit, having a first input terminal and a second input terminal and controlled by a first test enable signal to transmit a data signal on the first input terminal or a test signal on the second input terminal to an output terminal of the selection circuit to serve as an input signal; a control circuit controlled by a first clock signal and a second clock signal to generate a first control signal and a second control signal according to the input signal; and a scan-out stage circuit, wherein the scan-out stage circuit is controlled by the first test enable signal and a second test enable signal to generate the scan-out signal according to said only one of the first control signal and the second control signal. By implementing the embodiment of the invention, unnecessary power consumption of the scan chain can be reduced.

Description

Technical field [0001] The present invention relates to a flip-flop (flip-flop) design, and more particularly, to a scan flip-flop output. Background technique [0002] Scan chain (scan chain) are used in various manufacturing fault detection combinational logic block during the testing process. Typically, a scan chain by the scan flip-flop outputs a plurality of series composition, and adding delay chain (delay chain in the scan path between a scan input terminal of a data output terminal of the scan flip-flop and the output of the next flip-flop in the scan output ). A conventional scan output terminal of flip-flop may be used to transmit common output normal data (normal data) and scan data (scan data) of. Therefore, whether the transmission is normal data or scan data (scan data), the rear end of the common output terminal of the circuit is still operating, which adds unnecessary power consumption. Therefore, the need for an innovative scan output flip-flop design. Inventive...

Claims

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Application Information

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IPC IPC(8): G01R31/3185
CPCG01R31/3185G01R31/31712G01R31/318541G01R31/3177G01R31/31727
Inventor 翁伟哲黄恒亮
Owner MEDIATEK INC
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