Multi-station test equipment

Abstract

The invention aims to provide the multi-station test equipment which is multiple in test stations, small in overall size and low in cost. The equipment comprises a base, a carrier moving module, a black card testing module and a double-card testing module, wherein the carrier moving module comprises a Y-axis driving mechanism and a lifting carrier assembly arranged on the Y-axis driving mechanism, the black card testing module and the double-card testing module are arranged above the carrier moving module and are sequentially arranged in the length direction of the Y-axis driving mechanism, the black card testing module comprises a first testing station and a second testing station which are sequentially arranged in the length direction of the Y axis, an optical window is arranged on the second testing station, the double-card testing module comprises an X-axis driving mechanism, a Z-axis driving mechanism, and a gray card testing assembly and a supplementary card testing assembly which are arranged on the Z-axis driving mechanism in parallel, and the Z-axis driving mechanism is arranged at the movable end of the X-axis driving assembly. The equipment is applied to the technical field of optical testing.

Description

Technical field [0001] BACKGROUND applied to the optical testing of the present invention, particularly to a multi-station test equipment. Background technique [0002] In the test the optical image sensing, it is necessary, for the gray card and supplementary card image sensing tested by the black card and test card at different distances and different test, the image sensor chip and demonstrated performance They are not the same, while using the conventional rotary test equipment or by-side design. Because of the need to test a variety of cards and a variety of distances, different sample sizes required distance from the test card. If rotary, different test card volume, some need a lot of space, a small card accounts for a relatively small space, it is inconsistent. If the single direction are used side by side, they also take up more space. [0003] The China Patent Publication No. 208887897U, which discloses a method applied to gray, black card dark box test structures on the...

AI Technical Summary

Problems solved by technology

If they are all side by side in one direction, they also need to take up a lot of space

[0003] For example, the Chinese patent whose publication number is 208887897U discloses a gray and black card camera obscura structure applied to the testing of optical components. The gray card and black card can be switched through the gray card moving device arranged outside the camera camera. In order to achieve a more compact test structure, but if it needs to be compatible with more types of test environments, due to the large structure of a single device, adding multiple stations will still lead to a substantial increase in volume

Images