USB OTG test method

A test method and technology of a chip to be tested, which are applied in the field of USBOTG testing, can solve problems such as untested USBhost function and incomplete USBOTG function test, and achieve the effect of meeting the requirements of automatic chip testing, simple method, and convenient operation

Pending Publication Date: 2021-12-21
北京君正集成电路股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] In view of the incomplete test of the above USB OTG function, a method is proposed to solve the problem that the USB host function is not tested during the automatic test of the system function tester

Method used

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Embodiment Construction

[0032] In order to understand the technical content and advantages of the present invention more clearly, the present invention will be further described in detail in conjunction with the accompanying drawings.

[0033] Such as figure 2 Shown, the present invention relates to a kind of USB OTG test method, described method comprises the following steps:

[0034] S1, use a GPIO as a switch and configure it as an output port, and connect it between the two data lines of the chip under test and the two USB connectors;

[0035] S2, the two USB connectors are respectively connected to the PC and the U disk;

[0036] S3, through the program module to control the high and low level output by GPIO to determine the direction of the switch opening;

[0037] S4, through the level change of GPIO, the switch is connected to the first position to connect to one of the two USB connectors connected to the PC; or to the second position to connect to the one connected to the U disk in the tw...

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Abstract

The invention provides a USB (Universal Serial Bus) OTG (On-The-Go) test method, which comprises the following steps of: S1, taking a GPIO (General Purpose Input/Output) as a switch, configuring the GPIO into an output port, and connecting the output port between two data lines of a chip to be tested and two USB connectors; S2, connecting the two USB connectors with a PC (Personal Computer) and a USB flash disk; S3, controlling GPIO to output high and low levels through a program to determine the opening direction of the switch; S4, switching the switch to a first position through the level change of the GPIO, and connecting the switch to one of the USB connectors connected with the PC; or switching the switch to the second position to be connected to the other one of the two USB connectors to be connected with the USB flash disk, so that the USB OTG test is completed. The method meets the requirement for automatic testing of the chip, and is simple and convenient to operate.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a USB OTG testing method. Background technique [0002] In the chip production process, each chip must be functionally tested before leaving the factory. The chip must be placed on the system function test board for functional testing. When testing the USB function of the chip, usually connect USB_D+ and USB_D- to the USBconnector, and then Connect with PC through USB cable, PC is used as host (master device), chip is used as slave (peripheral device), test whether the communication between chip and PC is normal to verify the USB function of the chip. Such as figure 1 shown. [0003] However, whether the USB OTG device is a host or a slave, the two differential data lines, USB_D+ and USB_D-, are used to transmit data. The above test plan is to connect the chip to a PC for testing. The PC is the host, the chip is the slave, and the test chip and PC communication to verify ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H01L21/66
CPCG01R31/287H01L22/14
Inventor 任科飞
Owner 北京君正集成电路股份有限公司
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