Industrial defect detection method based on multi-task learning

A multi-task learning and defect detection technology, applied in the field of industrial defect detection, can solve the problems of low image contrast, large defect scale and appearance changes, unstable detection effect, etc., to achieve improved performance, good classification accuracy and generalization performance Effect

Pending Publication Date: 2021-12-21
聚时科技(上海)有限公司
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Problems solved by technology

[0006] The embodiment of the present invention provides an industrial defect detection method based on multi-task learning, which is used to solve the problem that the existing traditional industrial defect detection method is vulnerable to imaging conditions, small differences between defects and background, low image contrast, and the same type of defect scale. Interference with factors such as large changes in appearance and appearance, resulting in unstable detection results, which cannot meet the actual use requirements

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  • Industrial defect detection method based on multi-task learning
  • Industrial defect detection method based on multi-task learning
  • Industrial defect detection method based on multi-task learning

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Embodiment Construction

[0036] In order to verify the effect of the method provided in this embodiment, an experiment is done on the industrial data of photovoltaic cells in this embodiment. The data set contains ok pictures and pictures of 5 defect categories. The defect categories are fragments, cross hidden cracks, single hidden cracks, virtual welds and broken grids. The data set is divided into training set and test set according to the data ratio of 4:1. , the number of pictures in each category in the test set is shown in Table 1. Example pictures of each category such as Figure 4 As shown, it can be seen from the figure that there are mainly the following difficulties in processing the experimental data: the background of the picture is relatively complex, and the background texture will interfere with the judgment of defects; and the characteristics of some defects are similar, and the intra-class differences of some samples will be different. greater than the between-class differences. I...

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Abstract

The invention relates to the technical field of industrial defect detection, and discloses an industrial defect detection method based on multi-task learning. A defect classification task is subdivided into two subtasks, a normal/abnormal (ok/ng) dichotomy problem (recorded as task1) and a multi-label classification problem (recorded as task2) of n defect categories are solved by constructing a classification model based on a convolutional neural network (CNN). The classification model is composed of a base model and a head. The base model is responsible for extracting image features of an input image to obtain a corresponding feature image, and the base models of different tasks share network weights by adopting a hardsharing connection mode. The head is an output layer, and two branches are led out from the base model and are respectively used for solving the problems of task1 and task2; the two branches are respectively composed of a full connection layer and a sigmod function, and the probability of the ng category and the category probability of the n defects are output. The method can alleviate the problem that the current industrial defect detection method is easily interfered by imaging conditions, small differences between defects and backgrounds, low image contrast, large scale and appearance changes of defects of the same type and the like, resulting in unstable detection effect.

Description

technical field [0001] The invention relates to the technical field of industrial defect detection, in particular to an industrial defect detection method based on multi-task learning. Background technique [0002] Industrial defect detection is a technology that uses machine vision algorithms to automatically identify defects in images captured by industrial cameras. Specifically, industrial defect detection needs to judge whether there is a defect in the image and identify the type of defect, and then analyze the degree of defect of the industrial product. This technology can be widely used in various industrial fields to replace manual inspection and improve product production efficiency, detection accuracy and stability. [0003] Traditional machine vision-based industrial defect detection methods generally need to select an appropriate imaging scheme (such as bright field imaging, dark field imaging, and hybrid imaging, etc.) defects, and then use image processing alg...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/62G06N3/04G06N3/08
CPCG06T7/0004G06N3/08G06T2207/10004G06T2207/20081G06T2207/20084G06T2207/30108G06N3/047G06N3/048G06N3/045G06F18/241G06F18/2415
Inventor 李煜罗长志
Owner 聚时科技(上海)有限公司
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