Half-peak width automatic test tool

A technology of automated testing and half-peak width, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve problems such as low efficiency, and achieve the effect of improving test efficiency

Pending Publication Date: 2022-01-18
11TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0005] The invention provides a half-peak width automatic testing tool to solve the problem of low efficiency in the prior art when testing the half-peak width of cadmium zinc telluride based mercury cadmium telluride

Method used

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  • Half-peak width automatic test tool
  • Half-peak width automatic test tool
  • Half-peak width automatic test tool

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Embodiment Construction

[0028] Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present invention are shown in the drawings, it should be understood that the invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present invention and to fully convey the scope of the present invention to those skilled in the art.

[0029] Some embodiments of the present invention propose a half peak width automated test tooling, including:

[0030] The optical signal processing system is used to generate a test signal based on the sample. The sample stage in the optical signal processing system includes a positioning structure for positioning the sample; it can be understood that a positioning structure is provided on the sample stage, and the positioning structure can fix...

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Abstract

The invention discloses a half-peak width automatic test tool, and the half-peak width automatic test tool comprises an optical signal processing system which is used for generating a test signal based on a sample, wherein a sample stage in the optical signal processing system comprises a positioning structure which is used for positioning the sample; and a computer processing system which is in communication connection with the optical signal processing system and is used for receiving the test signal and realizing the automatic half-peak width test based on the test signal. The positioning structure is arranged on the sample table, the sample can be fixed on the sample table through the positioning structure, accurate positioning of a sample testing point is achieved, automatic testing can be achieved in cooperation with the computer processing system, manual operation in the prior art is avoided, and the testing efficiency is greatly improved.

Description

technical field [0001] The invention relates to the field of semiconductor material testing devices, in particular to a half-width automatic testing tool. Background technique [0002] In the field of infrared semiconductor materials, HgCdTe material itself is a direct band gap semiconductor material with adjustable band gap, which can cover the entire infrared band, making it an ideal infrared detector material. It has been used since the 1970s It is widely used in the preparation of different types of infrared detectors, and has become the most widely used detector material in the field of infrared detection. Liquid phase epitaxy is the main preparation technology in the field of infrared focal plane detectors. [0003] The mismatch degree of mercury cadmium telluride liquid phase epitaxy material has a good dependence on the twin crystal half peak width of the material. At the same time, both defects and deformation will cause the twin crystal half peak width to increase...

Claims

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Application Information

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IPC IPC(8): G01N23/20
CPCG01N23/20G01N2223/056G01N2223/1016
Inventor 李乾李达折伟林邢伟荣刘铭韦书领
Owner 11TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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