Current comparison circuit and image sunspot effect detection device and method

Abstract

The invention provides a current comparison circuit and an image sunspot effect detection device and method. The image sunspot effect detection device comprises the current comparison circuit, a light sensing module, a signal control module and a judgment module, and the light sensing module is used for outputting pixel voltage signals according to image signals; the current comparison circuit is connected with the photosensitive module and is used for carrying out current detection and comparison on the output end of the photosensitive module; the signal control module is connected with the current comparison circuit and is used for providing a control signal for the current comparison circuit; the judgment module is connected with the output end of the light sensing module and the output end of the current comparison circuit and used for conducting image sunspot judgment according to comparison signals of the current comparison circuit, whether the sunspot effect exists in an image or not can be rapidly detected through simple logic control, and meanwhile the overall circuit is low in power consumption.

Description

technical field [0001] The invention relates to the technical field of image sensors, in particular to a current comparison circuit, a device and a method for detecting the sunspot effect of an image. Background technique [0002] Complementary Metal-Oxide-Semiconductor (CMOS) refers to a technology used to manufacture large-scale integrated circuit chips or chips manufactured by this technology, and CMOS image sensors (CMOS Image Sensors) based on this chip technology Sensor, CIS), as an image sensing device, is irreplaceable in the image field, and as CMOS image sensor chips are more and more widely used, in order to show stable and reliable output images in various scenarios, The performance requirements of corresponding products are getting higher and higher. [0003] Among the various indicators of the CIS chip, the stability of the output image under strong light sources is the basic requirement of various CIS products, especially the CIS for vehicle applications, whi...

AI Technical Summary

Problems solved by technology

Based on the current pixel (Pixel) technology and the CIS control timing of the most widely used SS-ADC architecture, the sunspot effect will appear in the strong light source, which will cause the pixel to leak electricity after reset and reduce the reset voltage, resulting in the overall small or even small photoelectric signal collected. zero

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