Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Three-dimensional shape reconstruction simulation method based on infinite focusing scanning

A technology of three-dimensional topography and simulation method, which is applied in the field of three-dimensional precision measurement of microscopic vision, and can solve the problems of difficult simulation measurement model and so on.

Pending Publication Date: 2022-02-22
南京璟麒智能机器人系统控制研究院有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing simulation data acquisition method is mainly the image defocus simulation algorithm. When this algorithm generates the simulation image, the calculated point spread function has limitations, and it is difficult to change the simulation measurement model.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional shape reconstruction simulation method based on infinite focusing scanning
  • Three-dimensional shape reconstruction simulation method based on infinite focusing scanning
  • Three-dimensional shape reconstruction simulation method based on infinite focusing scanning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of this application.

[0038] Unless the context clearly states otherwise, the number of elements and components in the present invention can exist in a single form or in multiple forms, and the present invention is not limited thereto. Although the steps in the present invention are arranged with labels, they are not used to limit the order of the steps. Unless the order of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a three-dimensional shape reconstruction simulation method based on infinite focusing scanning, and the method comprises the steps: constructing a three-dimensional model, and collecting a real texture image of the surface of an object; performing equal-interval point sampling on the surface of the model according to the image resolution to obtain real point cloud data; processing the real point cloud data, mapping textures, simulating an image acquisition process of a microscope, and generating a sequence simulation image; and performing three-dimensional reconstruction on the sequence simulation image to generate simulation point cloud data. According to the method, any simulation measurement model with the continuous surface can be established, the complex and changeable surface topography can be simulated, the real point cloud data of the surface of the complex model can be obtained through the point sampling algorithm, the reconstructed point cloud data is compared with the real point cloud data, and the quality of the focusing evaluation algorithm can be quantitatively evaluated.

Description

technical field [0001] The invention relates to the field of micro-vision three-dimensional precision measurement, in particular to a three-dimensional shape reconstruction simulation method based on infinite focus scanning. Background technique [0002] Surface topography refers to microscopic surface geometric features such as roughness, waviness, and texture on the surface of an object. Surface topography optical measurement technology directly measures the regional topography of the surface of an object in a non-contact manner and reconstructs a three-dimensional structure. Focusing on topography Restoration technology is a kind of microscopic non-contact optical measurement technology, which has the advantages of no damage to the measurement surface, large inclination angle of the surface (up to 80°), and ability to provide surface color information. It mainly includes two parts, the focus evaluation algorithm and the three-dimensional reconstruction algorithm. Taking a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T17/05
CPCG06T17/05G06T2200/04
Inventor 崔海华黄怡廖永祥
Owner 南京璟麒智能机器人系统控制研究院有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com