Novel plasma analysis device and method
A technology for analyzing device and plasma, which is applied to measuring devices, analyzing materials, and using radiation for material analysis, etc., can solve the problems of inconvenient operation, difficult temperature adjustment, complicated plasma analysis, etc., and achieves the improvement of convenience and storage time. Effect
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[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0028] see Figure 1-5 , a novel plasma analysis device and method, comprising a storage box 1, a base 2, rollers 3, a power supply box 4, a temperature controller 9, an analysis box 11, a processor 13, a printing device 15, a display screen 16, and a refrigeration device 17 , a detection device 25 and an electron microscope 26, the bottom of the storage box 1 is provided with a power box 4, the inside of the power box 4 is provided with a storage battery 5, a...
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