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Time parameter measuring method, time parameter measuring circuit and time parameter measuring system

A technology of time parameter and measurement circuit, which is applied in the field of time parameter measurement, time parameter measurement circuit and system, can solve problems such as poor practicability, achieve good practicability and improve test efficiency

Pending Publication Date: 2022-03-01
HANGZHOU CHANGCHUAN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the purpose of the present invention is to provide a measurement method of time parameters, a time parameter measurement circuit and system, to alleviate the technical problem of poor practicability of the existing measurement methods of time parameters

Method used

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  • Time parameter measuring method, time parameter measuring circuit and time parameter measuring system
  • Time parameter measuring method, time parameter measuring circuit and time parameter measuring system
  • Time parameter measuring method, time parameter measuring circuit and time parameter measuring system

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Embodiment 1

[0038] According to an embodiment of the present invention, an embodiment of a method for measuring a time parameter is provided. It should be noted that the steps shown in the flow chart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and , although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0039] figure 1is a flowchart of a method for measuring a time parameter according to an embodiment of the present invention, such as figure 1 As shown, the method includes the following steps:

[0040] Step S102, acquiring signals to be measured, and converting the signals to be measured into multiple trigger signals, wherein at least one group of signals to be measured;

[0041] In the embodiment of the present invention, the time parameter measurement method is applied to a time parameter measure...

Embodiment 2

[0073] The embodiment of the present invention also provides a time parameter measurement circuit, refer to figure 2 The signal triggering unit and the programmable logic circuit part in it include: the signal triggering unit and the programmable logic circuit (FPGA shown in the figure), and the programmable logic circuit includes: delay measurement array with counting clock, internal memory array and measurement control unit;

[0074] A signal trigger unit is used to obtain the signal to be measured and convert the signal to be measured into multiple trigger signals, wherein one signal trigger unit corresponds to a group of signals to be measured;

[0075] The delay measurement array is connected to the signal trigger unit, and is used for synchronously measuring the edge time of multiple trigger signals, and obtaining the trigger time corresponding to each edge in each trigger signal, wherein each delay measurement array corresponds to one trigger signal, Multiple delay me...

Embodiment 3

[0086] The embodiment of the present invention also provides a time parameter measurement system, including: the time parameter measurement circuit in the second embodiment above, and also includes: a host computer; the host computer and the time parameter measurement circuit are connected through a BUS bus.

[0087] The computer program product of the method for measuring time parameters provided by the embodiments of the present invention includes a computer-readable storage medium storing program codes, and the instructions included in the program codes can be used to execute the methods described in the preceding method embodiments, specifically For implementation, reference may be made to the method embodiments, which will not be repeated here.

[0088] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working process of the above-described system and device can refer to the corresponding process in the forego...

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Abstract

The invention provides a time parameter measurement method, a time parameter measurement circuit and a time parameter measurement system, and the method comprises the steps: obtaining a to-be-measured signal, and converting the to-be-measured signal into a plurality of trigger signals; synchronously carrying out edge moment measurement on the multiple paths of trigger signals to obtain a trigger moment corresponding to each edge in each path of trigger signal; storing the trigger moment corresponding to each edge to a storage array corresponding to each path of trigger signal; and repeatedly executing the steps of reading the target triggering moment from the target address of the target storage array according to the measurement mode instruction and the position instruction sent by the upper computer, and calculating a target time parameter corresponding to the measurement mode instruction according to the target triggering moment until the measurement is finished. According to the time parameter measuring method, the upper computer can send the measuring mode instruction and the position instruction to the time parameter measuring circuit for multiple times according to needs, the purpose of measuring multiple types of time parameters of multiple sets of signals to be measured at a time is achieved, and practicability is good.

Description

technical field [0001] The invention relates to the technical field of time measurement, in particular to a time parameter measurement method, a time parameter measurement circuit and a system. Background technique [0002] The time measurement technology of programmable logic circuits has a wide range of applications in ranging, automated test equipment (ATE), time-of-flight measurement, positron imaging technology, laser, radar, oscilloscope and other technical fields. For example, as a kind of programmable logic circuit, the Carry (fast carry chain) structural unit inside the FPGA has stable delay characteristics and can be used as the smallest delay unit. The carry chain is also called a delay chain or delay line . The time measurement based on the FPGA delay chain mostly adopts the vernier method, which is divided into a coarse time measurement unit and a fine time measurement unit. The coarse time measurement adopts the pulse counting method, and the fine time measure...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 朱灿郎晨晨师宇飞陈清凤于洪涛
Owner HANGZHOU CHANGCHUAN TECH CO LTD