Method and device for evaluating soft error rate of electronic device and computer equipment

A technology of electronic devices and soft error rate, applied in the direction of instrumentation, design optimization/simulation, electrical digital data processing, etc., can solve problems such as test errors and achieve the effect of improving evaluation accuracy

Pending Publication Date: 2022-04-12
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

[0003] In order to solve the above problems, in the prior art, artificial α-particle radiation sources are generally used to carry out irradiation tests to obtain the soft error cross-section, and then the soft error rate is obtained by combining the α-particle emission rate of the device itself. , th...

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  • Method and device for evaluating soft error rate of electronic device and computer equipment
  • Method and device for evaluating soft error rate of electronic device and computer equipment
  • Method and device for evaluating soft error rate of electronic device and computer equipment

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Embodiment Construction

[0046] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0047] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. The technical features of the above embodiments can be combined arbitrarily. To make the description concise, all possible combinations of the technical features in the above embodiments are not described. Ho...

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Abstract

The invention relates to an electronic device soft error rate evaluation method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a flux-energy spectrum of particles released by a packaging material of the electronic device; performing reverse analysis on the electronic device, and determining medium attribute information between an active area of the electronic device and the packaging material; determining a particle flux-effective linear energy transfer value spectrum of the electronic device in the active area according to the flux-energy spectrum and the medium attribute information; acquiring a single event effect cross section value-effective linear energy transfer value spectrum of the electronic device obtained by performing an irradiation test on the electronic device; and calculating the particle flux-effective linear energy transfer value spectrum and the single event effect cross section value-effective linear energy transfer value spectrum to determine the soft error rate of the electronic device. By adopting the method, the evaluation precision of the soft error rate of the electronic device can be improved.

Description

technical field [0001] The present application relates to the technical field of electronic device reliability, in particular to a method, device, computer equipment, storage medium and computer program product for evaluating the soft error rate of electronic devices. Background technique [0002] With the development of electronic device reliability technology, 235U (uranium) and their daughter isotopes such as 232Th (thorium) as raw materials for nuclear reactions are relatively common radioactive elements. Due to the large amount of 235U naturally existing on the earth, these elements It is very easy to appear in various materials of semiconductor devices, such as molding compounds, solder balls, fillers, etc. These elements usually undergo alpha (alpha) decay, which in turn causes data loss, functional interruption and other adverse effects on semiconductor devices. [0003] In order to solve the above problems, in the prior art, artificial α-particle radiation sources a...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F119/02
Inventor 张战刚黄云雷志锋彭超何玉娟肖庆中路国光来萍
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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