Sketch recognition method based on double-layer structure
A sketch recognition and two-level technology, applied in the field of computer vision, can solve the problems of lack of description of shape features, large influence of noise samples, cumbersome training methods and processes, etc., to achieve simple and efficient calculation, high recognition rate, and reduce training cost effect
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[0050] Below in conjunction with accompanying drawing, the present invention is described in further detail:
[0051] figure 1 It is a flowchart of the method of the present invention, and the method includes the following contents:
[0052] A method for sketch recognition based on a double-hierarchy structure, the method comprising the following steps:
[0053] Obtain sketch samples in two formats, where the sketch samples include a two-dimensional image and a two-dimensional point set;
[0054] Construct a multi-level shape network based on the hierarchical idea of extracting deep features by convolutional neural network;
[0055] Build a multi-level visual network by constructing multi-scale residual blocks, inner residual blocks and outer residual blocks;
[0056] Using cross-entropy loss to train multi-layer shape networks, using cross-entropy loss and weight compression triplet center loss to train multi-layer vision networks;
[0057] Combine the trained multi-layer...
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