Method and system for measuring electromagnetic radiation of electronic device
A technology of electronic devices and electromagnetic radiation, applied in the direction of electromagnetic field characteristics, etc., can solve the problems of low test efficiency and large test error, and achieve the effect of reducing experimental workload, reasonably controlling errors, and avoiding errors.
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[0049] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0050] like figure 1As shown, the method for measuring electromagnetic radiation of an electronic device according to the embodiment of the present invention includes the following steps:
[0051] Step 1. Scan the test object to determine the size boundary surface A of the test object, where the boundary surface A is regarded as the location of the subsequent equivalent magnetic dipole model;
[0052] Step 2. Carry out near-field scanning on the test object to obtain the near-field magnetic field data of the measured point, wherein the magnetic field data includes the magnitude of the magnetic field intensity;
[0053] Step 3. According to the size of the test object boundary surface A and the near-field scanning results, a preliminary equivalent magnetic dipole model (such as model 1.0) is established in the boundary surface A based on the Hu...
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