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Method and system for measuring electromagnetic radiation of electronic device

A technology of electronic devices and electromagnetic radiation, applied in the direction of electromagnetic field characteristics, etc., can solve the problems of low test efficiency and large test error, and achieve the effect of reducing experimental workload, reasonably controlling errors, and avoiding errors.

Pending Publication Date: 2022-04-29
HUNAN UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

If the simulation results deviate too much from the actual radiation field, in order to correct the simulation results, it is necessary to measure again and obtain more radiation field information, and the overall test efficiency is low
In the process of experiment reset and test equipment and bench rebuilding, it is inevitable that there will be errors with the previous test, that is, the test error is large

Method used

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  • Method and system for measuring electromagnetic radiation of electronic device
  • Method and system for measuring electromagnetic radiation of electronic device
  • Method and system for measuring electromagnetic radiation of electronic device

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Embodiment Construction

[0049] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0050] like figure 1As shown, the method for measuring electromagnetic radiation of an electronic device according to the embodiment of the present invention includes the following steps:

[0051] Step 1. Scan the test object to determine the size boundary surface A of the test object, where the boundary surface A is regarded as the location of the subsequent equivalent magnetic dipole model;

[0052] Step 2. Carry out near-field scanning on the test object to obtain the near-field magnetic field data of the measured point, wherein the magnetic field data includes the magnitude of the magnetic field intensity;

[0053] Step 3. According to the size of the test object boundary surface A and the near-field scanning results, a preliminary equivalent magnetic dipole model (such as model 1.0) is established in the boundary surface A based on the Hu...

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Abstract

The invention discloses an electronic device electromagnetic radiation measurement method and system, and the method comprises the steps: carrying out the size scanning and near-field scanning of a test object, and determining the size boundary surface A and near-field magnetic field data of the test object; establishing a preliminary equivalent magnetic dipole model according to the size boundary surface A of the test object and the near-field magnetic field data, and performing real-time simulation to obtain simulation data; measuring far-field electric field data of the test object, comparing the far-field electric field data with the simulation data, and if a difference value between the far-field electric field data and the simulation data exceeds a preset numerical value, correcting the preliminary equivalent magnetic dipole model; when the number of the far-field measured point locations reaches a certain value and the difference between the far-field electric field data of the far-field measured point locations and the corresponding simulation data is smaller than a preset value, outputting a final equivalent magnetic dipole model so as to obtain radiation field information of other space point locations or areas. The method has the advantages of high measurement precision, high measurement efficiency and the like.

Description

technical field [0001] The invention mainly relates to the technical field of electronic devices, in particular to a method and system for measuring electromagnetic radiation of electronic devices. Background technique [0002] With the development of electronic information technology, the electromagnetic radiation generated by electronic devices is becoming more and more complex. Due to the complexity of electronic device circuits and commercial secrets, it is possible to simulate the electromagnetic radiation generated by directly establishing the circuit model of electronic devices. Too difficult and unrealistic. In order to solve the problems related to electromagnetic compatibility, the magnetic sensor can be used to scan the electronic device in the near field to obtain the surrounding electromagnetic radiation information, and the inverse calculation algorithm can be used to determine the radiation source of the electronic device. The magnetic field radiation generate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08
CPCG01R29/0814
Inventor 罗宝军付建勤杨加瑶梁薛霖
Owner HUNAN UNIV