Test device

A technology of testing equipment and testing units, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of affecting test results, easy heat dissipation and unable to preheat chip temperature stability, etc., to reduce heat dissipation, The effect of improving yield performance and improving practicability

Pending Publication Date: 2022-05-06
GLOBAL UNICHIP CORPORATION +1
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Problems solved by technology

Furthermore, since the test equipment is preheated in an open environment, the heat is more likely to dissipate and cannot achieve a better temperature stability for the preheated chip
[0003] However, some tests (such as electrical tests) are more sensitive to temperature, which will easily affect the test results when the temperature stability is not good, so it will also be reflected in the yield performance

Method used

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Embodiment Construction

[0013] Reference will now be made in detail to the exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used in the drawings and description to refer to the same or like parts.

[0014] Directional terms (eg, up, down, right, left, front, back, top, bottom) as used herein are used only as a reference to a drawn figure and are not intended to imply absolute orientation.

[0015] The present invention will be described more fully with reference to the accompanying drawings of this embodiment. However, the present invention can also be embodied in various forms and should not be limited to the embodiments described herein. The thickness, size or size of layers or regions in the drawings may be exaggerated for clarity. The same or similar reference numerals denote the same or similar elements, and the following paragraphs will not repeat them one by one.

[0016] fi...

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Abstract

The invention provides test equipment. The test equipment comprises a base and a preheating unit arranged on the base, the preheating unit comprises a gas generator, a blocking mechanism and a heating device. The gas generator is used for discharging air towards the base to form an air wall. The blocking mechanism is located above the air wall and forms a heat preservation space with the air wall. The heating device is arranged in the heat preservation space.

Description

technical field [0001] The invention relates to a testing device, in particular to a testing device with an air wall. Background technique [0002] Generally speaking, chips are often put into testing equipment, such as a handler (handler), to perform a final test (Final Test, FT) on the chip, and preheating must be performed in advance according to the test temperature conditions before testing. Furthermore, since the test equipment is preheated in an open environment, the heat is easily dissipated and cannot achieve a good temperature stability of the preheated chip. [0003] However, some tests (such as electrical tests) are more sensitive to temperature, which will easily affect the test results when the temperature stability is not good, so it will also be reflected in the yield performance. Contents of the invention [0004] The present invention is directed to a testing device, which can achieve a better temperature stability of the preheated chip, thereby improvin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H05K7/20
CPCG01R31/2874H05K7/20
Inventor 廖致杰孙育民程志丰
Owner GLOBAL UNICHIP CORPORATION
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