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Forming method of three-dimensional phase change memory and three-dimensional phase change memory

A phase-change memory and phase-change storage technology, which is applied to semiconductor devices, electrical solid-state devices, electrical components, etc., can solve the problems of increasing manufacturing costs and increasing the number of etching processes, and achieves the goal of reducing manufacturing costs and reducing process steps. Effect

Pending Publication Date: 2022-05-17
YANGTZE ADVANCED MEMORY INDUSTRIAL INNOVATION CENTER CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is to say, as the number of 3DPCM stacks increases, the number of etching processes will increase exponentially, which greatly increases the manufacturing cost.

Method used

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  • Forming method of three-dimensional phase change memory and three-dimensional phase change memory
  • Forming method of three-dimensional phase change memory and three-dimensional phase change memory
  • Forming method of three-dimensional phase change memory and three-dimensional phase change memory

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Embodiment Construction

[0070] Exemplary embodiments disclosed in the present application will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the specific embodiments set forth herein. Rather, these embodiments are provided for a more thorough understanding of the present application and for fully conveying the scope disclosed in the present application to those skilled in the art.

[0071] In the following description, numerous specific details are given in order to provide a more thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced without one or more of these details. In other examples, in order to avoid confusion with the present application, some technical features kno...

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Abstract

The embodiment of the invention provides a forming method of a three-dimensional phase change memory and the three-dimensional phase change memory, and the method comprises the steps: employing a plurality of initial etching patterns which extend along a first direction, and etching a first mask lamination layer, so as to form a first etching mask lamination layer; forming a second mask lamination layer on the surface of the first etching mask lamination layer; a plurality of secondary etching patterns extending in the second direction are adopted, the second mask lamination layer and the first etching mask lamination layer are etched in sequence, a secondary etching mask lamination layer is formed, and the secondary etching mask lamination layer is provided with latticed patterns; and etching the phase change storage unit lamination layer by taking the secondary etching mask lamination layer as a mask so as to form a columnar phase change storage unit.

Description

technical field [0001] The embodiment of the present application relates to the field of semiconductors, and relates to but not limited to a method for forming a three-dimensional phase-change memory and the three-dimensional phase-change memory. Background technique [0002] Phase change memory (Phase Change Memory, PCM) is a non-volatile solid-state storage technology that utilizes reversible, heat-assisted switching between states with different resistances of phase change materials. A phase-change material in a PCM cell can be located between two electrodes, and an electrical current can be applied to cause the phase-change material (or the portion of it that blocks the path of electrical current) to switch repeatedly between the two phases to store data. [0003] In a three-dimensional phase change memory (3D PCM), a memory chip is composed of many memory arrays with individual word lines (Word Line, WL) and bit lines (Bit Line, BL). Self-aligned PCM cells are formed a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L45/00H01L27/24
CPCH10B63/84H10N70/826H10N70/011
Inventor 刘峻
Owner YANGTZE ADVANCED MEMORY INDUSTRIAL INNOVATION CENTER CO LTD
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