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Information interaction system and method

A technology of information interaction and information transmission, which is applied in the field of information interaction systems, can solve the problems of long design cycle of development schemes, limitations of equipment and processes, and high development costs, and achieve the effect of avoiding hardware transformation, shortening the development cycle, and improving versatility

Pending Publication Date: 2022-05-27
NANTONG FUJITSU MICROELECTRONICS
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Problems solved by technology

[0004] However, the inventors of the present application have found through long-term research that it is often necessary to pay a huge price to modify the communication board of the equipment, the customized development cost is high, and the design cycle of the development plan is long. In addition, the customized development plan is often not It is versatile, and there are often greater restrictions on equipment and processes from different manufacturers, and the degree of support varies

Method used

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Embodiment Construction

[0024] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0025] see figure 1 , figure 1 It is a schematic structural diagram of an embodiment of the information interaction system of the present application. The information interaction system 100 provided by the present application includes an information reader 10 , a clamping device 20 , a plurality of test stations 30 and a plurality of test devices 40 . Wherein, the information reader 10 is used for scanning the pattern information on...

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Abstract

The invention discloses an information interaction system and method, and the system comprises a plurality of test stations. The information reader is used for scanning and reading the information of the to-be-tested piece; the clamping equipment is in serial communication with the information reader and is used for clamping and moving the to-be-tested piece; wherein the clamping equipment comprises an information sending module, the information sending module is used for setting an information sending station of the to-be-tested piece, and the information sending station is one of the plurality of test stations; a plurality of test devices, each of which is arranged in one-to-one correspondence with each of the test stations and is used for testing the to-be-tested piece in sequence; wherein the test device comprises a main test device, and the main test device is arranged at the test station corresponding to the information sending station and is in serial communication with the clamping device. Through the mode, the communication function between the clamping equipment and the test equipment can be realized, the cost is effectively saved, and the development period is shortened.

Description

technical field [0001] The present application relates to the technical field of semiconductor testing, and in particular, to an information interaction system and method. Background technique [0002] In order to realize the monitoring of the testing process of semiconductor products, the identity information of the semiconductor products will be used to correlate with the test data, so as to realize the information traceability of the testing process of the semiconductor products. [0003] The test mode for multi-station serial testing in the prior art usually adopts a customized development scheme. For example, for a specific type of equipment, it is necessary to modify the communication board of the test equipment and the clamping equipment, and add corresponding identification bits to identify the needs. Test station for obtaining product information. [0004] However, the inventors of the present application have found through long-term research that modifying the com...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R1/04G06K17/00
CPCG01R31/2601G01R1/0425G06K17/0022Y02P90/30
Inventor 于斌斌彭晶晶
Owner NANTONG FUJITSU MICROELECTRONICS
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