Material identification sensor and method for identifying material attributes by using same
A technology of material identification and material properties, applied in the field of sensors, can solve problems such as inability to effectively distinguish
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Embodiment 1
[0045] like figure 1 and 2 As shown, a material identification sensor in this embodiment, the sensor includes an encapsulation layer 1, a temperature measurement layer and a base layer 4 connected in sequence from top to bottom, and the temperature measurement layer includes a circular heat source 2 and The annular temperature sensor 3, the annular heat source 2 is arranged inside the annular temperature sensor 3, the encapsulation layer 1 is made of polydimethylsiloxane material, and the base layer 2 is Made of polyimide.
[0046]In a further scheme, the annular heat source 2 is laser-induced graphene obtained by irradiating the base layer 4 with laser light, the annular temperature sensor 2 is a thermistor, and the annular temperature sensor 3 passes through the magnetic field. The controlled sputtering is fixed on the base layer 4 . The two ends of the annular heat source 2 are respectively connected with a first electrode 21 and a second electrode 22, the first electrod...
Embodiment 2
[0049] This embodiment is a method for identifying material properties using the material identification sensor prepared in Embodiment 1, and the method is based on the following theory:
[0050] Simulation and physical model building:
[0051] According to the structure, size and material of the sensor described in Example 1, a model was built in Comsol for simulation, the ambient temperature was set to 20°C, and the heat source power was given. A probe is placed at the temperature sensor to simulate the effect of the properties of the placed material (thermal conductivity, density, and specific heat capacity) on the change in the "temperature-time" curve at the probe. The simulation results are as Figure 3-5 shown, from image 3 It can be seen that as the thermal conductivity of the material changes from 0.0381W / (mk) to 38100W / (mk), the "temperature-time" curve at the probe hardly changes, which indicates that the change in thermal conductivity of the material does not af...
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