LED chip sorting method
A technology for LED chips and sorting, applied in sorting and other directions, can solve problems such as low LED chip sorting efficiency, and achieve the effects of being conducive to mass production implementation, solving low efficiency and simple operation
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Embodiment 1
[0043] see figure 1 , shows the LED chip sorting method in the first embodiment of the present invention, and the method specifically includes steps S01 to S02.
[0044] Step S01 , the LED chips in the concentrated area where the same BIN is concentratedly distributed on each LED wafer are orderly arranged on the corresponding empty blue film in a reverse mold manner until the empty blue film is completely drained.
[0045] Wherein, in the embodiment of the present invention, the LED chip sorting method is applied after the LED chip testing process, and is used for sorting the tested LED chips according to a corresponding manner. Specifically, in the LED chip testing process, firstly, a dicing machine or a cutting machine is used to dicing and cutting the LED wafer to form multiple independent LED chips, and at the same time, the backside of the LED wafer that is cut to form multiple LED chips is pasted. The blue film is adhered. At this time, two probes in each group of prob...
Embodiment 2
[0053] see figure 2 , shows the LED chip sorting method in the second embodiment of the present invention, and the method specifically includes steps S11 to S13 .
[0054] Step S11, sorting out each LED chip with bad photoelectric parameter data determined by the photoelectric characteristic test on each LED wafer and each LED chip with bad appearance determined by the appearance test.
[0055] In the embodiment of the present invention, referring to the foregoing method embodiment, before sorting the LED chips, the LED chips need to be tested for optoelectronic characteristics and appearance. At this time, the tested LED chips with poor optoelectronic parameter data and The LED chips with poor appearance are marked, which is specifically marking the coordinate position of the LED chip and marking the BIN value as the secondary BIN. The specific photoelectric parameter data is bad because the tested photoelectric parameter data exceeds the reasonable range of photoelectric pa...
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