Calibration interface board and system for universal card slot of integrated circuit automatic test equipment

A technology of automatic test equipment and integrated circuits, applied in electronic circuit testing, measuring devices, measuring electrical variables, etc., can solve the problems of increasing and changing manufacturing costs and management costs, and achieve flexible adaptation, convenient operation, and improved test efficiency. Effect

Inactive Publication Date: 2022-06-28
NANJING MACROTEST SEMICON TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, once the calibration interface board design is fixed, it cannot be changed with different resource boards configured by ATE
As a result, ATE machines with different configurations require different calibration interface boards. As the number of calibration board interface boards increases, manufacturing costs and management costs will increase.

Method used

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  • Calibration interface board and system for universal card slot of integrated circuit automatic test equipment
  • Calibration interface board and system for universal card slot of integrated circuit automatic test equipment
  • Calibration interface board and system for universal card slot of integrated circuit automatic test equipment

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Embodiment Construction

[0027] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solutions of the present invention more clearly, and cannot be used to limit the protection scope of the present invention.

[0028] In the description of the present invention, it should be understood that the terms "center", "portrait", "horizontal", "top", "bottom", "front", "rear", "left", "right", " The orientation or positional relationship indicated by vertical, horizontal, top, bottom, inner, outer, etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and The description is simplified rather than indicating or implying that the device or element referred to must have a particular orientation, be constructed and operate in a particular orientation, and therefore should not be construed as limiting the in...

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PUM

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Abstract

The invention discloses a calibration interface board and system for a universal card slot of integrated circuit automatic test equipment, and belongs to the technical field of integrated circuit automatic test, the calibration interface board comprises a basic connection board, the basic connection board is provided with a plurality of standard interfaces with first signal ports and second signal ports side by side at intervals, the first signal port of each standard interface is externally and electrically connected with a calibration source and a measuring instrument through a circuit bus and is also used for being electrically connected with an ATE resource board card located in a universal card slot of an ATE machine, and the second signal port of each standard interface is electrically connected with a board card calibration card corresponding to the calibration requirement of the ATE resource board card. According to the calibration interface board and system for the universal card slot of the integrated circuit automatic test equipment, the functions are integrally designed, the operation is flexible, and the applicability is high.

Description

technical field [0001] The invention belongs to the technical field of automatic testing of integrated circuits, and in particular relates to a calibration interface board and a system for a universal card slot of automatic testing equipment of integrated circuits. Background technique [0002] ATE (Automatic Testing Equipment) used in large-scale automated testing of integrated circuits has the characteristics of high integration, high precision, and high stability. High integration not only means that a single ATE device generally has hundreds of thousands or even tens of thousands of input and output (I / O) channels to meet the needs of parallel testing of as many large-scale integrated circuits as possible; it also means that a single ATE device generally has different test resources. , presented in various types of resource boards; to meet the test requirements of different types of integrated circuits or system-on-chip (SoC) chips for different modules. High precision ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R35/00G01R1/04
CPCG01R31/28G01R35/00G01R1/04
Inventor 不公告发明人
Owner NANJING MACROTEST SEMICON TECH CO LTD
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