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Ultrahigh vacuum in-situ dripping device

An ultra-high vacuum and in-situ technology, which is applied in measuring devices, instruments, scanning probe microscopy, etc., can solve problems such as expensive, difficult to obtain, high-purity inert gas pollution or variables, and achieve carbon pollution reduction, low cost effect

Pending Publication Date: 2022-07-26
SHANGHAI TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The two methods have their own advantages and disadvantages. The first method is simple and easy to replicate, but high-purity inert gases may still introduce pollution or variables; the second method achieves the ultimate in water purification, but the liquid nitrogen cold head device is complicated and expensive , it is difficult for general laboratories to obtain

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  • Ultrahigh vacuum in-situ dripping device

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Embodiment Construction

[0065] The specific embodiments of the present invention will be further described in detail below with reference to the accompanying drawings. These embodiments are only used to illustrate the present invention, but not to limit the present invention.

[0066] In the description of the present invention, it should be noted that the terms "center", "portrait", "horizontal", "top", "bottom", "front", "rear", "left", "right", " The orientations or positional relationships indicated by vertical, horizontal, top, bottom, inside, and outside are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplification It is described, rather than indicated or implied, that the referred device or element must have, be constructed, and operate in a particular orientation, and therefore should not be construed as limiting the invention. Furthermore, the terms "first" and "second" a...

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Abstract

The invention relates to the technical field of ultrahigh vacuum equipment, in particular to an ultrahigh vacuum in-situ water dripping device which comprises a water dripping cavity with a hollow interior to form a water dripping cavity. A sample feeding assembly for feeding a sample into or out of the water dripping cavity, a sample table assembly for supporting the sample in the water dripping cavity, a cold pump assembly for vacuumizing the water dripping cavity, and a water and gas path assembly for providing water and gas into the water dripping cavity are mounted on the water dripping cavity; the temperature control cold head assembly is arranged at a cold head in the water dripping cavity and used for forming part of water vapor into water drops and dripping the water drops to the surface of a sample; the thermocouple assembly is used for detecting the temperature of the cold head of the temperature control cold head assembly; the observation window is used for an operator to observe the internal condition of the water dripping cavity; the sample injection assembly, the sample table assembly, the cold pump assembly, the water-gas path assembly, the temperature control cold head assembly, the thermocouple assembly and the observation window are all connected with the dripping cavity in a sealing fit manner. The temperature control cold head assembly controls the temperature of the cold head and is low in cost, simple in structure and easy to machine.

Description

technical field [0001] The invention relates to the technical field of ultra-high vacuum equipment, in particular to an ultra-high vacuum in-situ dripping device. Background technique [0002] Water covers more than 70% of the earth's surface and plays an extremely important role in many biological, physical and chemical processes. In recent years, with the increasingly in-depth study of surface science, the nature of the liquid-solid interface has received more attention , especially the interaction of different solid surfaces with water. At present, the nanoscale high-precision surface structure characterization methods, such as Scanning Tunneling Microscope (STM), or electronic structure characterization methods (such as X-ray photoelectron spectroscopy), are mostly in the ultra-high vacuum environment, because the atmospheric environment There are always unpredictable, unidentifiable gas molecules that may adsorb on sample surfaces or dissolve in water to form contamina...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q30/20G01Q60/10
CPCG01Q30/20G01Q60/10
Inventor 韩钰周琴赵爱迪
Owner SHANGHAI TECH UNIV
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