Low-cost smart surface acoustic wave temperature sensor test system and test method

Abstract

The invention discloses a low-cost smart surface acoustic wave temperature sensor test system and test method, and relates to the field of surface acoustic wave temperature sensor test, the system comprises a sensor test device, a network analyzer and a PC terminal, the sensor test device is connected with the network analyzer, and the network analyzer is connected with the PC terminal; the sensor testing device comprises a testing plate, a sensor crimping device and a fixed base; the testing plate comprises a sensor positioning plate, a vertical conductive film, an electrical connecting plate and a radio frequency connector; the vertical conducting film is clamped between the sensor positioning plate and the electrical connecting plate, the electrical connecting plate is connected with the radio frequency connector, and the test plate is installed on the fixed base through the fixing assembly; the sensor crimping device is used for fixing the to-be-tested sensor during testing. The device is simple in structure and durable, the testing method is simple and convenient, the surface acoustic wave temperature sensors can be tested in batches, and the testing cost of the surface acoustic wave temperature sensor chip is reduced.

Description

technical field [0001] The invention relates to the testing field of surface acoustic wave temperature sensors, in particular to a low-cost smart surface acoustic wave temperature sensor testing system and testing method. Background technique [0002] With the continuous development of science and technology, surface acoustic wave temperature sensors are widely used in all walks of life. In order to ensure the reliability and stability of the SAW temperature sensor, it needs to be fully tested. SAW temperature sensors need to be tested for many indicators, such as resonant frequency, resonant Q value, out-of-band suppression, spurious peaks, etc. After the temperature sensor is packaged, it is necessary to test each indicator one by one. The index test of the surface acoustic wave temperature sensor belongs to the chip-level test. Not only the number of products to be tested is huge, but also it must be a non-destructive test. After the test is completed, the appearance of...

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Problems solved by technology

[0006] In view of the above-mentioned defects of the prior art, the technical problem to be solved by the present invention is how to solve the current situation of relying on expensive radio frequency probe stations for testing: the radio frequency probe station realizes the electrical connection of radio frequency through probes, which is expensive and expensive to purchase. High cost; the RF probe station equipment is sophisticated and easy to damage, and requires personnel with relevant professional knowledge to be trained and operated by a dedicated person; the RF probe station is large in size, heavy, takes up a lot of office space, and has high cost of use

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