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Semiconductor measurer and semiconductor measuring method

A test device and semiconductor technology, applied in the direction of single semiconductor device test, measurement device, analog circuit test, etc., can solve problems, hinder the accurate measurement of graded output voltage, increase the price of the tester, etc., and achieve the effect of low cost

Inactive Publication Date: 2006-08-02
SHARP KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

So, the problem is that these errors prevent the higher accuracy measurement of the gradation output voltage, which is necessary for liquid crystal drivers with 256, 512 or more gradation levels
Thus, the above-mentioned solution of using a dedicated comparator which increases the price of the tester is not desirable.
The choice of a dedicated comparator also poses the problem that such dedicated comparators are difficult to obtain on a special order basis, thus causing problems during emergency maintenance services

Method used

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  • Semiconductor measurer and semiconductor measuring method
  • Semiconductor measurer and semiconductor measuring method
  • Semiconductor measurer and semiconductor measuring method

Examples

Experimental program
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Effect test

Embodiment 1

[0069] FIG. 1 shows a block diagram of a main circuit block of a semiconductor testing apparatus according to the present invention. The same circuit blocks and the same components as in the prior art (refer to FIG. 24 ) are denoted by the same numerals, and repeated explanations are omitted here. In the drawing, numeral 100 denotes a semiconductor test device including an output voltage test device 50 and comparison voltage generation data input devices 101 and 102 . Output voltage testing device 50 comprises test voltage input device 51, DAC 106, DAC 107, high level comparator 52 (hereinafter referred to as comparator 52 sometimes for short), low level comparator 53 (hereinafter sometimes referred to as comparator 53 for short) and The comparison result output device 56 . The output voltage testing device 50 is composed of electronic circuits for testing the voltage to be measured. The test voltage input device 51 is composed of an electronic circuit for inputting a voltag...

Embodiment 2

[0079] FIG. 2 shows a block diagram of a semiconductor test device including a plurality of main circuit blocks of the semiconductor test device of FIG. 1 . The semiconductor test device 200 includes a plurality of semiconductor test devices 100 shown in FIG. Input corresponding to the output of the DUT. The semiconductor testing device 200 further includes a calibration data generating device 210 which is externally connected to the tester control device 40 . Each semiconductor testing device 100 includes comparison voltage generation data input devices 101 and 102 . The comparison voltage generation data input unit 101 is supplied with high-level common comparison voltage generation data IVHB from the tester control unit 40 and high-level individual comparison voltage generation data IVHC from the correction data generation unit 210 . The comparison voltage generation data input unit 102 is supplied with low-level common comparison voltage generation data IVLB from the tes...

Embodiment 3

[0085] FIG. 4 shows a schematic block diagram of one circuit block of the semiconductor testing device according to the present invention. The second semiconductor testing device 200 (this circuit block corresponds to the semiconductor testing device 100 of FIG. 1 and the semiconductor testing device 200 of FIG. 5) ), constituted in the form of a module, for example, is arranged on the external input side of the prior art semiconductor tester (semiconductor tester) 15 . This module allows the prior art semiconductor test apparatus 15 to be used as-is without modification, while still improving the accuracy of semiconductor integrated circuit testing. In addition, when the semiconductor test devices 100, 200, and 201 include an integrated circuit driving section (not shown) for driving DUTs constituting the semiconductor integrated circuits, the semiconductor test devices (semiconductor test system) can perform testing more efficiently.

[0086] On the input side of the semico...

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Abstract

A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus comprises output voltage testing means and comparison voltage generation data inputting means. The output voltage testing means comprises test voltage inputting means, comparison voltage generating means, a high level comparator, a low level comparator, and comparison result outputting means. The high level comparator and the low level comparator constitute comparing means for comparing a voltage to be tested, with a comparison voltage.

Description

field of invention [0001] The present invention relates to a semiconductor testing device and a semiconductor testing method, in particular to a semiconductor testing device and a semiconductor testing method capable of accurately testing the graded output voltage of a semiconductor integrated circuit having a large number of output terminals, each of which is used to output multiple stage output voltage (gradation output voltage) to drive a liquid display panel or the like. Background technique [0002] The driving mode of the liquid crystal display panel (TFT liquid crystal display panel) is divided into two types according to the polarity switching mode of the liquid crystal driving voltage, that is, a dot inversion mode and a line inversion mode. As for the liquid crystal driving voltage output from the semiconductor integrated circuit of the liquid crystal driving (hereinafter referred to as liquid crystal driving device), this voltage output is generated as a predeterm...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/28G01R31/316G01R31/3183G01R31/319G09G3/00G09G3/36G11C29/38
CPCG09G3/006G09G3/3688G09G3/3696G11C29/38G09G3/36
Inventor 坂口英明永广雅之森雅美
Owner SHARP KK
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