Light sensor device and disc detector uisng light sensor device

Abstract

A photosensor device, which is constituted of a light-applying fiber (107) to apply an inspection light to a subject to be inspected; a light-receiving fiber (108) to receive a reflected light from the subject to be inspected; a laser beam source (114) to emit the inspection light to the light-applying fiber; and a photosensor (113) to receive the reflected light via the light-receiving fiber; which are disposed in a casing (102). A disk inspection apparatus for inspecting surface conditions of a disk, which is constituted of a turning table (204) for rotating the disk; a photosensor body (205) disposed opposite to the surface of the disk; and a transfer means for reciprocally transferring the photosensor body in a direction perpendicular to a rotating direction of the disk along the surface of the disk; wherein the above photosensor device is utilized as the photosensor body.

Description

technical field [0001] The present invention relates to an optical sensor device for detecting whether there are fine scratches or deformations on the surface of an object to be inspected, and a disc inspection device for inspecting whether a disc has defects using the optical sensor device. Background technique [0002] Generally, when this kind of optical sensor device is used to check whether there are scars, pinholes or deformations formed on the surface of the object to be inspected, the body shell and the surface of the object to be inspected are arranged opposite to each other at a predetermined interval, and the throwing device set from the body shell The optical fiber emits inspection light to the object to be inspected, and the optical sensor receives reflected light from the object to be inspected through the incident fiber. [0003] The reflected light received by the light sensor is photoelectrically converted and then output to the computing unit to judge wheth...

AI Technical Summary

Problems solved by technology

[0009] However, the disk inspection device described in the above publication uses an expensive CCD array as a light receiving device for receiving reflected light from the disk, and it is necessary to process the light received by the CCD array for each pixel. Therefore, the structure is complex and the unit price of the product is high. Therefore, if multiple disc inspection devices of this kind are configured in the manufacturing process, the equipment cost will be high and the feasibility will be lacking.

[0010] As a result, the disc inspection apparatus inspects only completed discs, and thus there is a problem that, even if a defect occurs during the manufacturing process, the defect cannot be found until it is completed, so that the yield of the product is lowered.

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