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Functional test method for measuring fault at single end of difference serial circuit

A technology of functional testing and circuit division, which is applied in the field of functional testing capable of testing single-ended faults of differential serial circuits, and can solve problems such as the flow of faulty products into the next production process, and achieve small PCB size, low device cost, and test circuit simple effect

Inactive Publication Date: 2003-05-07
HUAWEI TECH CO LTD
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Problems solved by technology

Then, at the receiving end of the test circuit, although there is a single-ended fault in the differential reception, since the relative level relationship of the pair of differential lines has not changed, U2 will still generate a normal TTL signal "RXD", which will not affect Communication, faulty products missed inspection, so that faulty products flow into the next production process

Method used

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  • Functional test method for measuring fault at single end of difference serial circuit
  • Functional test method for measuring fault at single end of difference serial circuit
  • Functional test method for measuring fault at single end of difference serial circuit

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Embodiment Construction

[0016] When the circuit under test is a differential receiving circuit, the test circuit used is as follows: figure 2 shown. figure 2 The measured signals are RXD+ and RXD-. The sending signal TEST is converted by the two chips 26C31 of U4 and U5 respectively, and each chip outputs one channel, which is provided to the circuit under test as a pair of differential signals. The enable control lines of the two chips are in an anti-phase relationship and are not valid at the same time. The sending signal (TEST) is alternately converted into two TTL signals through two interface circuits (U4, U5), and input as a pair of differential signals to the differential receiving circuit under test; alternately testing and judging the single-ended output signal of the differential receiving circuit under test, When the output signals in both cases are normal, the function of the tested differential receiving circuit is normal, otherwise it is not normal.

[0017] Among them, the function...

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Abstract

A function test method enables to measure differential serial circuit single end fault characterizing in containing the following steps: a switching in signals via interface circuit separately b. to measure, judge related single end output signals of tested differential circuit separately, if signals of boths dies are normal, the differential circuit function is normal, or not so. In testing, this invention only measures one end of a pair of differential signals then to judge separately the tested two ends signals to decide if the tested circuit normal or not, so as to avoid lost test.

Description

technical field [0001] The invention relates to a functional testing technology of a differential serial circuit, in particular to a functional testing method capable of testing a single-end fault of a differential serial circuit. Background technique [0002] In order to ensure the quality of products during mass production, the production process of electronic products includes a testing process, and Function Test is one of them. [0003] The circuit form of the differential serial port is generally as follows figure 1 shown. For its functional test method, generally another test circuit will be designed to connect with it. The CPU of the test circuit will use the agreed serial communication protocol to communicate with the test circuit under test. If the communication is normal, the function of the circuit under test is considered to be normal; otherwise , it is considered that the circuit under test is faulty. The form of the test circuit used is generally similar to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02G01R31/28G06F11/26
Inventor 段海峰
Owner HUAWEI TECH CO LTD
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