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Accuracy calibration of birefringence measurement systems

A measurement system, birefringence technology, applied in the field of systems of birefringence properties

Inactive Publication Date: 2005-01-26
HINDS INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, such systems require very precise assembly for accurate results

Method used

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  • Accuracy calibration of birefringence measurement systems
  • Accuracy calibration of birefringence measurement systems
  • Accuracy calibration of birefringence measurement systems

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Experimental program
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Embodiment Construction

[0027] Figure 1 depicts the main optical elements of a system that can be calibrated according to the invention. These elements include as light source 20 a HeNe laser at a wavelength of 632.8 nanometers (nm). Beam "B" emanating along the optical path from the light source has a cross-sectional area or "spot size" of approximately 1 millimeter (mm).

[0028] Source beam "B" is directly incident on polarizer 22 whose polarization direction is oriented at +45° with respect to the baseline axis. High extinction polarizers are preferred, such as Glan-Thomson calcite polarizers. Polarizers 22 with stable precision and indexed rotators are also preferred.

[0029] Polarized light from polarizer 22 is incident on optical element 25 of photoelastic modulator 24 (FIGS. 1 and 5). In a preferred embodiment, the photoelastic modulator (hereinafter "PEM") is a low birefringence version of Model PEM-90 I / FS50 manufactured by Hinds Instruments, Inc., of Hillsboro, Oregon. While a PEM is ...

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Abstract

Provided are systems and methods using a Soleil-Babinet compensator (101) as a standard for calibrating birefringence measurement systems. Highly precise and repeatable calibration is accomplished by the method described here because, among other things, the inventive method accounts for variations of retardance across the surface of the Soleil-Babinet compensator (101). The calibration technique described here may be employed in birefringence measurement systems that have a variety of optical setups for measuring a range of retardation levels and at various frequencies of light sources.

Description

[0001] This application claims as the priority date the filing date of US Provisional Patent Application No. 60 / 329,680, which is hereby incorporated by reference. technical field [0002] This application relates primarily to systems for the precise measurement of the birefringence properties of optical elements, and in particular to calibrating such systems using Soleil-Babinet compensators. Background technique [0003] Many important optical materials exhibit birefringence. Birefringence means that light of different linear polarizations travels through a material at different speeds. These different polarizations are often viewed as two mutually orthogonal components of polarized light. [0004] Birefringence is an inherent property of many optical materials and can be induced by external forces. Retardation or retardation represents the overall effect of birefringence along the propagation path of the beam in the sample. If the incident beam is linearly polarized, t...

Claims

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Application Information

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IPC IPC(8): G01J4/04G01M11/00G01N21/23
CPCG01J4/04G01N21/23
Inventor 王宝良
Owner HINDS INSTR
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