Method for measuring critical current homogenity of every portion for super conducting strip

A technology of superconducting strips and critical currents, which is applied in the direction of measuring devices, magnetic properties measurement, and material analysis through electromagnetic means, which can solve the problems of superconducting strip damage and long length of superconducting strips, and reduce equipment The effect of cost, small workload and high spatial precision

Inactive Publication Date: 2005-02-16
INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0017] In order to overcome the shortcomings of the above-mentioned prior art, the present invention provides a new method for detecting the uniformity of the critical current of the superconducting strip by using a non-contact meas

Method used

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  • Method for measuring critical current homogenity of every portion for super conducting strip
  • Method for measuring critical current homogenity of every portion for super conducting strip
  • Method for measuring critical current homogenity of every portion for super conducting strip

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Embodiment Construction

[0061] Figure 3a In order to apply an external magnetic field to the superconducting strip, the external magnetic field 3 is perpendicular to the superconducting strip 1, and it is required that the external magnetic field 3 is larger than the penetrating magnetic field of the superconducting strip and is a DC back field. The applied magnetic field 3 consists of Figure 4 The back field magnet 4 is produced, the back field magnet 4 is a pair of copper wire wound multi-layer solenoid coils, and the back field magnet 4 is connected with a direct current to generate a direct current magnetic field, and the magnitude of the external magnetic field 3 can be above 400Gs It meets the requirement of measuring the critical current uniformity of each part of the existing superconducting strip.

[0062] Figure 3b In order to measure the residual magnetism of the superconducting strip, the direction of the residual magnetic field of the superconducting strip is also perpendicular to t...

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Abstract

The method for measuring critical current uniformity of all the portions of superconducting tape material, is characterized by that energizing back field magnet with direct current to produce stable-constant PC magnetic field used as background magnetic field, making the superconducting tape material be passed through said background magnetic field; when the superconducting tape material is moved to the exterior of the background magnet, utilizing Hall probe to measure residual magnetic field of the superconducting tape material, when the residual magnetic field of superconducting tape material is measured, the space in which the superconducting tape material is placed has no background magnetic field; the ratio value of residual magnetic fields of all the portions of superconducting tape material is equal to the ratio value of critical currents of all the portions of superconducting tape material, i.e. it is uniformity of critical current of superconducting tape material.

Description

technical field [0001] The invention relates to a method for measuring the critical current uniformity of each part of a superconducting tape, which belongs to the field of superconducting engineering. Background technique [0002] Superconducting tapes are generally long strips with a length between 100 and 1000 meters and a cross-sectional size of about 4*0.2mm. In practical applications, it is necessary to understand the variation of the critical current of the superconducting strip along the axial direction. The so-called measurement of the critical current uniformity of each part of the superconducting strip refers to measuring the ratio of the critical current between the sections in the axial direction of the superconducting strip with a distance of a few millimeters or longer, the purpose of which is to detect the superconducting strip. Whether there is a large change in the critical current along the axial direction between the various sections of the strip. Set t...

Claims

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Application Information

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IPC IPC(8): G01N27/00G01R33/12
Inventor 陆岩许熙王银顺肖立业
Owner INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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