The invention belongs to the technical field of optical precision testing, and relates to a dual-wavelength phase-shift interference method based on a partial compensation method and an implementationdevice. The method comprises the steps of building a partial compensation method dual-wavelength phase-shift interferometer, and acquiring measured wavefront wrapped phases of two single wavelengths;modeling a partial compensation method dual-wavelength ideal interferometer, and acquiring residual wavefronts and wrapped phases of the two single wavelengths; eliminating known and unknown wavefront variations in the measured wavefront wrapped phases by adopting an error separation and elimination algorithm, and finally optimizing and reconstructing surface-shape error of the measured asphericsurface by adopting reverse iteration. The device comprises a first laser, a second laser, a first slit, a second slit, a first plane mirror, a second plane mirror, a first beam splitter, a second beam splitter, a beam expander, a collimating mirror, a standard plane mirror, a phase shifter, a partial compensating mirror, a measured aspheric surface, an imaging lens and an interferogram acquisition assembly containing a sparse array sensor. The method and device provided by the invention are particularly applicable to processing quality measurement for gradient aspheric surfaces with a small surface-shape error, molded aspheric surfaces with a great surface-shape error and free curved surfaces.