Measuring device using supershort pulse frequency resolution optical switch method
A frequency resolution, optical switching technology, applied in the direction of instruments, etc., can solve the problems of increasing the difficulty of adjusting the optical path, difficult to coat the film layer, and many mirrors, etc., to achieve the effect of convenient adjustment of the optical path, low cost, and elimination of broadening.
Inactive Publication Date: 2005-11-09
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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[0010] But in fact, the current beam splitter is difficult to meet the above requirements. For example, for ultrashort pulses below 20 femtoseconds, in order to reduce the time-domain broadening of the transmitted light, the thickness of the reflective mirror is required to be no more than 50 microns, and the surface must be smooth. degree and base strength, which is more difficult to process
In addition, the semi-transparent and semi-reflective film layer with a wide spectrum is also difficult to plate, and the cost is also high.
[0011] In addition, the measurement method of the frequency-resolved optical switch method needs to ensure that the two pulses have the same optical path, by figure 1 It can be seen that more mirrors are used, which also increases the difficulty of optical path adjustment
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[0027] The present invention will be further described below in conjunction with accompanying drawing.
[0028] see first figure 2 and image 3 , the ultrashort pulse frequency resolution optical switch method measuring device of the present invention comprises a beam splitter 1, a micro-movement stage 2 controlled by a computer, a lens 6, a nonlinear crystal 7, an aperture 8 and a spectrometer 9, and is characterized in that the splitter Beamer 1 is a reflective Damman grating composed of a first 1×2 reflective Damman grating 11, a second 1×2 reflective Damman grating 12 and a third 1×2 reflective Damman grating 13. For the beam splitter, the second 1×2 reflective Damman grating 12 is placed on the micro-motion table 2 controlled by the computer, and its positional relationship is: when a beam of femtosecond pulsed light is in the vertical plane and is less than A small angle of incidence of 2° is incident on period d and depth λ c On the first reflective 1×2 Damman grati...
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The invention relates to a measuring device using ultrashort impulse frequency distinguish optical switch method that includes beam separator, micro-checker controlled by computer, lens, non-linear crystal, diaphragm, and spectroscopic instrument. The feature is that the beam separator is made up of the first reflecting type Daman grating and the second reflecting Daman grating and the third reflecting Daman grating. The second reflecting Daman grating is set on the computer controlled micro-checker. The invention is tightly structure and easy to manufacture.
Description
technical field [0001] The present invention relates to ultrashort laser pulses, in particular to an ultrashort pulse frequency resolution optical switch method measuring device, which is an ultrashort pulse measurement device using a reflective Dammann grating and a single frequency resolution optical switch method , the device is a double-layer three-grating structure, one of which acts as a moving arm. Background technique [0002] Since the 1990s, ultrashort pulses, especially femtoseconds (fs=10 -15 Second) laser technology has achieved rapid development. Due to the ultrashort time-domain characteristics of femtosecond laser pulses, it is possible to study ultrafast phenomena in the fields of physics, chemistry, biology, and medicine. At the same time, femtosecond laser pulses also have extremely high peak power, which is a powerful tool for the study of various nonlinear phenomena. [0003] The research of various phenomena under the action of femtosecond laser pulse...
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Inventor 周常河戴恩文
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI