Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electrostatic capacitance type apparatus for measuring Young's modulus

A technology of Young's modulus and electrostatic capacitance, which is applied in the field of electronics, can solve problems such as large deviation of Young's modulus value, poor accuracy and consistency, and visual errors of telescopes, so as to achieve good consistency, overcome visual errors, and save energy. cost effect

Inactive Publication Date: 2005-12-07
UNIV OF ELECTRONIC SCI & TECH OF CHINA
View PDF0 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0026] The measurement of Young's modulus by this method involves many steps of measurement tools, and the operator is prone to visual errors when adjusting the telescope, which makes the accuracy and consistency of the measurement poor, and the system error introduced is too large, and finally the obtained The Young's modulus value deviates greatly

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electrostatic capacitance type apparatus for measuring Young's modulus
  • Electrostatic capacitance type apparatus for measuring Young's modulus
  • Electrostatic capacitance type apparatus for measuring Young's modulus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0079] A device for measuring Young's modulus of metal wire

[0080] Such as Figure 4 As shown, the horizontal bevel gear 16 on the lower plate of the inner casing of the device is connected with a screw and the knob, the longitudinal bevel gear is connected with a lower gear, this gear is connected with the other two transmission gears, and the central threaded shaft 15 is connected with one of the gears. Adjusting the height at 12 and 15, this threaded shaft rod is connected with the insulating material plate 15, and the left and right sides of the insulating plate are respectively connected with an upper and lower positioning shaft rod 14, the insulating shaft sleeve is located below it, and a copper plate 12 is embedded in the insulating plate, and another copper plate 12 is embedded in the insulating plate. A copper plate 11 is connected to a shaft 5 to act as the moving plate of the capacitor, and can move up and down. The insulating sleeve 8 is conn...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This invention provides a static condensed device for testing young's modulus, which is a condenser composed of an upper conductive metallic plate and a lower conductive metallic plate, one of which is taken as a mobile plate fixed by connecting an insulation material with a metal rod, the other pole plate is used for adjusting the distance between the up and down copper plates to constitute a static condensed young's modulus test device. When a slight charge happens to the distance between the plates, the capacitance changes accordingly in terms of the theory of gap variable of a plane condenser to test the metal young's modulus valve of rigid material.

Description

Technical field: [0001] The invention belongs to the field of electronic technology, and particularly relates to the technology of measuring the Young's modulus value of solid rigid materials such as metal wires. Background technique: [0002] As we all know, Young's modulus refers to the elastic coefficient of the deformation of a solid under the action of an external force, and its meaning is a physical quantity that characterizes the low deformation resistance of a solid material. [0003] According to most of the current methods of measuring Young's modulus using the optical lever method, it consists of a set of telescopes, brackets, wire fasteners, reflective plane mirrors, optical levers, weights, screw micrometers, vernier calipers, and meter rulers. . The measurement is to place the optical lever on the surface of the hollow cylinder, align the telescope with the reflective plane mirror, adjust the focal length of the telescope objective lens so that the scale scale...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N3/14
Inventor 严一民姚列明陈彦
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products