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Cross and sequent test interface device for low voltage differential signal

A low-voltage differential, testing interface technology, applied in the direction of logic circuit connection/interface layout, digital circuit testing, electronic circuit testing, etc., to achieve the effect of low cost, simple device structure and convenient application

Active Publication Date: 2006-04-05
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

None of them can completely form a cross-connection relationship of input and output with LVDS level interface directly.

Method used

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  • Cross and sequent test interface device for low voltage differential signal
  • Cross and sequent test interface device for low voltage differential signal

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Experimental program
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Embodiment Construction

[0012] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0013] figure 1 It is a schematic structural diagram of the test interface device proposed by the present invention. Such as figure 1 As shown, the test interface device proposed by the present invention includes a control interface unit, an MCU unit, a jumper setting unit, an interlock control unit and a cross matrix unit. The following will describe in detail in combination with specific implementation manners respectively.

[0014] control interface unit

[0015] The control interface unit is used to realize the communication connection with an external console (such as a computer), and is mainly designed for the device to realize automatic program-controlled configuration. The callable configuration control program module and operation interface can be customized on the external console, and the configuration information is transmitted...

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PUM

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Abstract

The invention discloses a low voltage differential signal cross testing interface which comprises a control interface unit, a MCU unit, a jumper wire setting unit, a inter-lock control unit and a cross matrix unit, wherein the control interface unit is used to connect the communication of the outer control tables; the jumper wire setting unit is used to choose the running mode of the device and transmit the running mode information to the MCU unit and the inter-lock control unit; the inter-lock control unit is used to through one setting mode to the cross matrix unit and lock the other setting mode at the same time; the MCU unit receives the order from the control interface unit and translates the order into the corresponding low voltage differential signal relation, it sets the MCU corresponding IO pitch to the needed hurdle and uses inter-lock control unit to control the cross matrix unit; the cross matrix unit is used to achieve the cross sequence of the low voltage differential signal.

Description

technical field [0001] The invention relates to a digital signal interface test technology in the field of electronics and communication, in particular to a test interface device for low voltage differential (LVDS) signals. Background technique [0002] In the application of signal transmission in electronic and communication systems, in order to improve the reliability of signal transmission, the external interface signal with higher speed in the single board is often designed as LVDS level mode. For example, the external high-speed clock transmission line of a single board or a small system, and the external HW line in a time-division multiplexing system are usually designed in the form of an LVDS level interface. [0003] When testing single boards or small systems whose external interfaces are LVDS level signals, especially in batch testing, these LVDS signal interfaces are usually connected to the corresponding interfaces of the test platform, and these interfaces are c...

Claims

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Application Information

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IPC IPC(8): G01R31/319G01R31/28H03K19/0175
Inventor 朱红军张来喜刘长有
Owner ZTE CORP