Compound whole-working order testing device control and protection system, and failure protection scheme
A technology for controlling protection and testing devices, which is used in overload protection devices, single semiconductor device testing, etc. to achieve the effect of easy coordination, clear function division, and safe operation.
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[0041] Attached below figure 1 The present invention is further described.
[0042] The circuit part of the synthetic full working condition test device mainly includes three parts: the low-voltage charging circuit, the synthetic full working condition test circuit and the low voltage high current source. The auxiliary equipment mainly includes two sets of water cooling devices, one set (No. The thyristor valve is used to supply water, and the other set (No. 2) is used to supply water to the test valve alone. Therefore, the underlying control and protection subsystem of the control and protection system of the synthetic full-working condition test device mainly includes the following five independent control and protection subsystems:
[0043] ●Charging circuit control and protection subsystem
[0044] ●Test circuit control and protection subsystem
[0045] ●Low-voltage and high-current source control and protection subsystem
[0046] ●No.1 water cooling device control and...
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