Nonvolatile semiconductor memory device
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[0103] Nonvolatile semiconductor memory devices according to embodiments of the present invention will be described hereinafter in detail with reference to the drawings.
[0104] In the following embodiment, a four-level NAND cell type EEPROM device will be described as a representative embodiment. However, the present invention is not limited to the four-level NAND cell type EEPROM device, and is applicable to a nonvolatile semiconductor memory device in which n-level data (n is a natural number of 3 or more) is stored in a memory cell.
[0105] Four-level data "00", "01", "10", "11" are stored in the memory cell, a state in which the threshold voltage of the memory cell is lowest (e.g., a negative state of the threshold voltage) is regarded as data "11" (or a "0" state), a state in which the threshold voltage of the memory cell is second low (e.g., a positive state of the threshold voltage) is regarded as data "10" (or a "1" state), a state in which the threshold voltage of the memory c...
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