X-ray imaging apparatus, image processing apparatus and image processing method

a technology of image processing apparatus and x-ray imaging, which is applied in the field of x-ray imaging apparatus, image processing apparatus and image processing method, can solve the problems of difficult to distinguish between materials having similar x-ray attenuation characteristics and materials that overlap with each other among the constituent materials of objects, and achieve the effect of improving the accuracy of material separation of objects

Active Publication Date: 2016-07-28
SAMSUNG ELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Benefits of technology

[0006]One or more exemplary embodiments provide an X-ray imaging apparatus that improves the accuracy of material separation of an object and scattering correction using a multi-energy image, an image processing apparatus, and a method for the same.

Problems solved by technology

However, materials having similar X-ray attenuation characteristics are difficult to be distinguished from each other in an X-ray image, and in a case of an X-ray projection image, materials overlapped with each other among the constituent materials of the object are difficult to be distinguished from each other.

Method used

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  • X-ray imaging apparatus, image processing apparatus and image processing method
  • X-ray imaging apparatus, image processing apparatus and image processing method
  • X-ray imaging apparatus, image processing apparatus and image processing method

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Embodiment Construction

[0060]Certain exemplary embodiments are described in greater detail below with reference to the accompanying drawings, wherein like reference numerals refer to like elements throughout. In this regard, the exemplary embodiments may have different forms and should not be construed as being limited to the descriptions set forth herein. Accordingly, the exemplary embodiments are merely described below, by referring to the figures, to explain aspects of the present description. Sizes of elements in the drawings may be exaggerated for convenience of explanation. In other words, since sizes and thicknesses of components in the drawings are arbitrarily illustrated for convenience of explanation, the following exemplary embodiments are not limited thereto.

[0061]Hereinafter, an X-ray imaging apparatus, an image processing apparatus, and a method for the same according to exemplary embodiments will be described in detail with reference to the accompanying drawings.

[0062]FIG. 1 is a control bl...

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Abstract

An X-ray imaging apparatus may include an image acquirer configured to acquire a plurality of X-ray images of an object in different energy bands; and an image processor configured to perform scattering correction on the plurality of X-ray images to remove X-ray scattering from the plurality of X-ray images, perform material separation on the plurality of X-ray images on which the scattering correction has been performed to acquire material information of at least one material included in the object, and repeatedly perform the scattering correction and the material separation depending on whether a predetermined condition is satisfied.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application claims priority from Korean Patent Application No. 10-2015-0010423, filed on Jan. 22, 2015, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.BACKGROUND[0002]1. Field[0003]Apparatuses and methods consistent with exemplary embodiments relate to an X-ray imaging apparatus that separates a material using a multi-energy X-ray image, and an image processing apparatus, and an image processing method.[0004]2. Description of the Related Art[0005]An X-ray imaging apparatus is an apparatus that irradiates an object with X-rays and detects the X-rays transmitted through the object to image the internal structure of the object. Based on X-ray attenuation or absorption depending on characteristics of a material constituting the object, it is possible to image the internal structure of the object from the intensity of the X-ray transmitted through the object. However,...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): A61B6/00G06T5/00G06T7/00
CPCA61B6/5282A61B6/482A61B6/463G06T2207/30024G06T7/0081G06T5/002G06T2207/10116G06T7/0012A61B6/4241A61B6/5235G01N23/083G01N23/085G06T5/00
Inventor YI, JAE MOCKKANG, DONG-GOOSUNG, YOUNG HUNLEE, JAE HAKCHOI, JI YOUNGHAN, SEOK MIN
Owner SAMSUNG ELECTRONICS CO LTD
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