Image detection scanning method for object surface defects and image detection scanning system thereof

Inactive Publication Date: 2020-11-19
GETAC TECH CORP
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides an image detection system for detecting defects on the surface of an object. The system includes a driver component, a light source component, a photosensitive element, and a processor. The driver component moves the object's surface area to a detection position, and the light source component provides detection light to illuminate the position. The photosensitive element captures a detection image and a test image, and the processor analyzes the test image to determine if the photosensitive element is normal. The system can generate a warning signal if the photosensitive element is abnormal and perform a calibration operation accordingly. The method includes sequentially moving one of the surface areas to the detection position, providing detection light to illuminate the position, configuring the photosensitive element to face the detection position, and capturing a detection image of each area. The technical effect of this invention is an improved image detection system that allows for efficient and accurate detection of defects on the surface of an object.

Problems solved by technology

Defective products cannot be sold; otherwise malfunctioning end products can be resulted if defective intermediate products are sold to other manufacturers for processing.
However, manually inspecting whether a product contains defects yields less satisfactory efficiency, and has a greater probability of misjudgment, leading to the problem of an unmanageable product yield rate.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image detection scanning method for object surface defects and image detection scanning system thereof
  • Image detection scanning method for object surface defects and image detection scanning system thereof
  • Image detection scanning method for object surface defects and image detection scanning system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019]FIG. 1 shows a schematic diagram of an image detection scanning system for object surface defects according to an embodiment of the present disclosure. Referring to FIG. 1, the image detection scanning system for object surface defects is suitable for scanning an object 2 so as to obtain at least one detection image of the object 2. In some embodiments, the surface of the object 2 may include at least one surface defect, and the corresponding detection image also presents an image block with the surface defect. Herein, the surface defect is a three-dimensional structure. Herein, the three-dimensional structure is in a scale of mm to μm.

[0020]The image detection scanning system for object surface defects includes a driver component 11, a light source component 12 and a photosensitive element 13. Referring to FIG. 1 to FIG. 4, FIG. 2 shows a function block diagram of an image detection scanning system for object surface defects in FIG. 1 according to an embodiment, and FIGS. 3 a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An image detection scanning method for object surface defects and an image detection scanning system thereof are provided. The method includes capturing a test image by a photosensitive element according to test light, determining whether a setting parameter of the photosensitive element is normal by a processor according to the test image, generating a warning signal if the setting parameter is abnormal, performing a detection procedure if the setting parameter is normal, sequentially moving one of a plurality of areas on a surface of an object to the detection position in the detection procedure, providing detection light by a light source component in the detection procedure to illuminate the detection position, and capturing a detection image of each of the areas sequentially located at the detection position by the photosensitive element according to the detection light in the detection procedure.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application claims priority from U.S. Patent Application Ser. No. 62 / 848,216, filed on May 15, 2019, the entire disclosure of which is hereby incorporated by reference.BACKGROUND OF THE INVENTIONField of the Invention[0002]The present disclosure relates to an image detection scanning method for object surface defects and an image detection scanning system thereof.Description of the Prior Art[0003]The defect detection for products is a critical step in the industrial manufacturing process. Defective products cannot be sold; otherwise malfunctioning end products can be resulted if defective intermediate products are sold to other manufacturers for processing. One conventional defect detection method is manually inspecting a product under test by naked eyes or by touching of hands, so as to determine whether a product contains defects, such as recesses, scratches, color differences or damages. However, manually inspecting whether a prod...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06K9/46G06T7/00G06T7/586
CPCG06T7/0004G06T7/586G06K9/4661G01N21/8806G01N21/9515G01N21/952G01N21/8851G01N2021/8883G06V10/145G06V10/22G06V2201/06G06N3/045G06N3/08G01N21/3581G06T7/97G01N2021/8887G06T7/40G06T2207/10152G06T2207/20084G06N3/04G06T2207/20081G06T7/11G01J3/2823G01N21/956G06T7/45G06F17/16G06N3/063G01N21/01G06V20/64G06V20/647G06F18/2148G06N3/047G06V10/25G06V10/60G06V10/143G06V10/242
Inventor TSAI, KUN-YUYANG, PO-YU
Owner GETAC TECH CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products