Three-dimensional shape measuring apparatus

a three-dimensional shape and measuring apparatus technology, applied in the direction of measurement devices, instruments, computing, etc., can solve the problems of reducing the rate at which light passes through the pinhole (coefficient of utilization) and the measurement takes a long tim

Inactive Publication Date: 2002-04-16
TAKAOKA ELECTRIC MFG
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Problems solved by technology

This method, however, requires moving the object stage in the Z direction for each of a large number of points to be measured, and therefore takes a long time for measurement.
This slight shifting in the Z position causes errors.
In addition, deviations in scanning and sampling timing cause errors in the XY positions of the measured points of a confocal image.
However, there are following problems with the above conventional three-dimensional shape measuring apparatuses with an arrayed confocal imaging system.
In such a configuration, however, the rate at which the light passes through the pinholes (coefficient of utilization) decreases considerably, and it is difficult to obtain light with the intensity necessary for measurement.
Therefore, the diameter of the spot is relatively larger than that of the pinholes and it is difficult to sufficiently increase the coefficient of utilization of illuminating light.
However, a large-scale facility is needed for manufacturing this apparatus because of its very complicated structure.
Moreover, laser light must be used for the reflex hologram to fulfill its function, but laser light is prone to interfere and is not suited for measurement of a three-dimensional shape.
Therefore, measuring the height of such a point is impossible.
Measurement in color is also impossible with laser light.
Furthermore, this apparatus cannot separate illuminating light and reflected light by a dichroic mirror, a technique which is necessary for fluorescent observation in the biotechnology field.
Therefore, these apparatuses need a precision moving mechanism for moving the object stage in the Z direction, which makes them complex and large.
Further, in the step moving method in which the object stage is moved step by step to acquire a confocal image at each stop position, it takes a very long time to obtain a large number of confocal images while maintaining the required high accuracy of the stop positions.
On the other hand, in the continuous moving method in which the object stage is continuously moved to acquire a confocal image at each predetermined position, it is difficult to maintain the required accuracy because the acquisition timing affects the positional accuracy.
Finally, although the measuring speed of the three-dimensional shape measuring apparatus using an arrayed confocal imaging system has been remarkably improved as described above, the speed is not yet sufficient for various applications in which a high measuring speed is required.
A further improvement in the measuring speed has been difficult because of the following reasons.
Since the maximum value detection processing is thus carried out for a great number of pixels one by one in turn, processing of one confocal image takes a long time.

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Embodiment Construction

First, the three-dimensional shape measuring apparatus using an arrayed confocal imaging system of the first invention of this application is explained by way of embodiments.

FIG. 5 shows an embodiment of the three-dimensional shape measuring apparatus using an arrayed confocal imaging system of the first invention of this application. The light emitted from a light source 6 passes through a pinhole 1 to become light from a point light source. The light from the pinhole 1 is refracted into parallel light rays by a collimator lens 7, and then polarized into linearly polarized light by a polarizer 20. The linearly polarized light next enters a light path diverging optical element 21. The light path diverging optical element 21 is a polarized-light beam splitter which allows linearly polarized illuminating light to pass through. The illuminating light which passes through the light path diverging optical element 21 enters the microlenses in a microlens array 17, and is converged at the ...

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Abstract

A three-dimensional shape measuring apparatus which has an improved arrayed confocal imaging system.A three-dimensional shape measuring apparatus using a confocal imaging system which has a new means for changing the distance in the Z direction between the object and the object-position-in-focus, instead of an object stage moved in the Z direction. This means shifts the object-position-in-focus in the Z direction by refraction. One means inserts a plurality of transparent flat plates between the objective lens and the object-position-in-focus in turn. Another means uses a transparent flat plate made of a material for which the refractive index changes according to the voltage applied and is disposed between the object and the object-position-in-focus.A three-dimensional shape measuring apparatus using a confocal imaging system wherein an image processor estimates the position from which the intensity of the reflected light for each pixel of the confocal image becomes maximum by interpolation of a value from the curve of the relationship between the intensity of light detected and the distance from the object-position-in-focus to an object point.

Description

1. Field of the InventionThe present invention relates to a three-dimensional shape measuring apparatus, and particularly to a three-dimensional shape measuring apparatus using a confocal imaging system.2. Discussion of the BackgroundA three-dimensional shape measuring apparatus using a confocal imaging system is used for automatic inspections of minute products on production lines.The basic configuration of the confocal imaging system is shown in FIG. 1. Light emitted from a pinhole 1 passes through a half mirror 2. The light from the half mirror 2 is then converged by an objective lens 3 toward an object. The light which strikes the surface of the object is reflected. Of the reflected light, the light which enters the objective lens 3 is caused to converge by the objective lens 3, and is then deflected by the half mirror 2 toward the pinhole 4 which is disposed at the same position optically as the pinhole 1. The quantity (intensity) of the light passing through the pinhole 4 is m...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): G01B11/24G01B11/02
CPCG01B11/24G01B11/026
Inventor ISHIHARA, MITSUHIRO
Owner TAKAOKA ELECTRIC MFG
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