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4 results about "Euhedral and anhedral" patented technology

Euhedral crystals (also known as idiomorphic or automorphic crystals) are those that are well-formed, with sharp, easily recognised faces. The opposite is anhedral (also known as xenomorphic or allotriomorphic): a rock with an anhedral texture is composed of mineral grains that have no well-formed crystal faces or cross-section shape in thin section. Anhedral crystal growth occurs in a competitive environment with no free space for the formation of crystal faces. An intermediate texture with some crystal face-formation is termed subhedral.

Crystal processing method

The invention provides a crystal processing method which is used for processing equipment to cut a crystal, the processing equipment comprises a cutting tool and a bearing film, the method comprises the following steps: the crystal has a front surface and a back surface which are oppositely arranged, the front surface of the crystal is provided with a first protective layer bonded by wax, and the back surface of the crystal is provided with a second protective layer bonded by wax; forming a cut unit; the cut unit is bonded to the bearing film, and the bearing film is located on the back face of the cut unit; placing the bearing film adhered with the cut unit on processing equipment, and controlling a cutting tool to cut the cut unit to form cut particles; and taking down the bearing film and the protective layer on the cut particles to form crystal particles. The protective layers bonded by wax are arranged on the two surfaces of the crystal, so that the fracture resistance of the crystal in the cutting process can be remarkably enhanced, and edge collapse, fragmentation or internal micro-cracks generated in the cutting process of the crystal are greatly reduced, thereby directly improving the processing yield of crystal particles.
Owner:SHENYANG HEYAN TECH CO LTD

X-ray monochromator device and method of adjusting an x-ray monochromator device

PendingCN122330960AHigh energyMonochromator
This invention relates to the field of synchrotron radiation optical elements and discloses an X-ray monochromator device and an adjustment method for the X-ray monochromator device. The device includes: a base assembly; a spectroscopic crystal assembly, including a single-crystal crystal plate and two flexible connectors, the single-crystal crystal plate having a front and a back, the front being configured to face the X-ray incident direction, and the two flexible connectors symmetrically arranged on one side of the back of the single-crystal crystal plate and connecting the single-crystal crystal plate and the base assembly; a deformation detection element, which monitors the curvature change of the single-crystal crystal plate in real time and generates a feedback signal; and a loading mechanism, including at least two force-applying parts, at least two force-applying parts disposed between the two flexible connectors, at least two force-applying parts acting on the back, and the loading mechanism being able to control the at least two force-applying parts to act on the single-crystal crystal plate according to the feedback signal. This invention operates entirely at room temperature, and can achieve continuously adjustable curvature of the single-crystal crystal plate, no thermally induced lattice damage, and high energy resolution.
Owner:ANHUI ABSORPTION SPECTROMETER EQUIP CO LTD

Method of manufacturing a composite structure including a rating step

The invention relates to a method of manufacturing a composite structure comprising a thin film made of single-crystal silicon carbide, arranged on a carrier substrate made of polycrystalline silicon carbide, comprising the following steps: 1) providing at least one donor substrate made of single-crystal silicon carbide, said donor substrate having a front face and a back face, said front face potentially having defects, called primary defects; 2) checking the quality of said at least one donor substrate using a photoluminescence-like imaging technique to extract a map of the front face, called a first map, listing the primary defects, said primary defects being identified as micro-hole type, complex star stack defect type or point defect type; 3) transferring a thin film obtained from a surface layer of said at least one donor substrate onto a carrier substrate made of polycrystalline silicon carbide to obtain a composite structure and a remaining donor substrate; 4) checking the free surface of the thin film of the composite structure by means of a defect checking technique using ultraviolet laser beam scattering to extract a map of the free surface, called a second map, listing the defects, called secondary defects; 5) rating said composite structure, which comprises comparing said first map and said second map.
Owner:SOITEC SA

Ground diffuse reflection light supplementing method and system for flat single-axis tracker

The application provides a ground diffuse reflection light supplementing and efficiency increasing method and system for a flat single-axis tracker, the method comprising: laying a reflecting material on the ground between the front and rear rows of trackers for supplementing light to the front and back surfaces of a bifacial photovoltaic module on the tracker; calculating real-time power generation of the tracker at any time T and annual total power generation; finding a target correction amount of a tracking rotation angle of the tracker at the time T for keeping the real-time power generation of the tracker at the time T maximum, and a target arrangement parameter of the reflecting material for maximizing the annual total power generation of the tracker; correcting the tracking rotation angle of the tracker according to the target correction amount at each time, and laying the reflecting material according to the target arrangement parameter. The application improves the power generation of a tracking system of a bifacial photovoltaic module by optimizing the tracking rotation angle of the tracker and the arrangement of the ground reflecting material.
Owner:ARCTECH SOLAR HOLDING CO LTD