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Electro-optical device, method of testing the same, and electronic apparatus

An electro-optical device and a technology for checking signals, which are applied in the fields of optics, nonlinear optics, instruments, etc., can solve problems such as the difficulty in the inspection practice of the probe touching the inspection terminal

Active Publication Date: 2008-08-27
SEIKO EPSON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In other words, in the case of miniaturization of the element substrate, there is a technical problem that it is practically extremely difficult to touch the probes to the terminals for inspection.

Method used

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  • Electro-optical device, method of testing the same, and electronic apparatus
  • Electro-optical device, method of testing the same, and electronic apparatus
  • Electro-optical device, method of testing the same, and electronic apparatus

Examples

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Embodiment Construction

[0073] Embodiments of the present invention will be described with reference to the drawings. The following embodiments are embodiments in which the electro-optical device of the present invention is applied to a liquid crystal device.

[0074]

[0075] First, refer to figure 1 The overall structure of the liquid crystal device of this embodiment will be described through FIG. 3 .

[0076] figure 1 is a plan view of the liquid crystal device viewed from the counter substrate side, figure 2 yes figure 1 Sectional view at H-H'. exist figure 1 as well as figure 2 Among them, the liquid crystal device is constituted by a TFT array substrate 10 and a counter substrate 20 which are an example of the "element substrate" of the present invention and which are arranged facing each other. exist figure 1 In , an area surrounded by a dotted line 200 shows an example of the arrangement of the counter substrate 20 with respect to the TFT array substrate 10 . The TFT array subst...

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PUM

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Abstract

The invention provides an electro-optical device such as liquid crystal device can downsize and easily performing a test. The electro-optical apparatus is provided with a plurality of external circuit connection terminals which are arrayed along one side of a projected area projected from a counter substrate on one side of a peripheral area of an element substrate, and to which an external circuit for supplying various signals for displaying images on a plurality of display elements is connected and testing image signals are collectively supplied in the case of performing display tests. A plurality of first test terminals to which first test signals required in addition to testing image signals for display tests are supplied, are arranged on the end of the array of the plurality of external circuit connection terminals in the projected area. The first test terminals are arranged in a pitch wider than that of the external circuit connection terminals.

Description

technical field [0001] The present invention relates to the technical field of an electro-optical device such as a liquid crystal device, an inspection method thereof, and an electronic device including the electro-optical device. Background technique [0002] Such an electro-optical device is constructed by sandwiching an electro-optic substance between a pair of element substrates and a counter substrate. In a pixel region (or also referred to as an image display region) in which a plurality of pixels are arranged planarly in a matrix, a display element including an electro-optic substance is formed for each pixel. In addition, on the element substrate or the counter substrate, the counter substrate is formed to be smaller than the element substrate when viewed in plan, and in the peripheral area located around the periphery of the pixel area, along the direction of the element substrate protruding or exposed from the counter substrate, On one side, a plurality of externa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/136G02F1/133G02F1/13G09G3/36
Inventor 石井贤哉
Owner SEIKO EPSON CORP