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Storage device testing method and testing device

A storage device and testing method technology, applied in the direction of digital signal error detection/correction, digital recording/reproduction, etc., can solve the problems of single testing method of test software, difficulty in achieving the maximum performance of storage devices, etc., achieve reduced coupling, easy conversion, The effect of improving accuracy

Inactive Publication Date: 2008-11-12
NEW H3C TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] What the present invention aims to solve is the problem that the existing storage device testing software has a single testing method and it is difficult to achieve the maximum performance of the storage device

Method used

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  • Storage device testing method and testing device
  • Storage device testing method and testing device
  • Storage device testing method and testing device

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Experimental program
Comparison scheme
Effect test

Embodiment 2

[0111] Test software is embedded in BIOS (Basic Input Output System, Basic Input Output System) in embodiment two, breaks away from operating system and realizes, and its structure is as follows Figure 6 shown.

[0112] The difference between embodiment two and embodiment one includes: the tested storage device is a SATA hard disk and an ATA (Advanced Technology Attachment) hard disk, so the operation layer needs to load the ATA driver and the SATA driver; the interactive layer is built on the user setting interface of the BIOS , to provide users with tools to configure the required test types and parameters; at the same time, because they are separated from the operating system, the support functions used by the interaction layer, operation layer and drivers, such as memory allocation / release functions, memory copy functions, and string operations Functions, display output functions, and data conversion functions need to be implemented separately. The similarities between E...

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Abstract

This invention discloses a test method for storage devices including: loading a storage device drive providing a single operation interface, carrying out a test flow structured for the single operation of storage device, in which, the single operation is done by a single operation interface driven by the storage device, which can apply different test modes to test storage devices, support synchronous tests to multiple and multiple kinds of storage devices and the invented test software can work not only on an operation system or on a environment without operation system.

Description

technical field [0001] The invention relates to computer and network storage technologies, in particular to a method for testing a storage system and a device for applying the method. Background technique [0002] The storage device is the most important role in the storage system, and the performance of the storage device directly affects the performance of the entire system. The impact and vibration of the storage device during transportation or use may cause damage to the storage device, so a comprehensive reliability test is required for the storage device. [0003] Taking the hard disk test as an example, the existing hard disk test software usually tests the hard disk by directly calling the standard API (Application Program Interface) interface provided by the operating system, and the operating system completes the hard disk drive through the underlying hard disk drive. read and write, its structure is as follows figure 1 shown. [0004] Those skilled in the art k...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11B20/18
Inventor 瞿凯朱根俊
Owner NEW H3C TECH CO LTD