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Optical device testing apparatus and testing method

A technology of optical devices and detection devices, applied in the direction of using optical devices, measuring devices, laser components, etc., can solve the problems of optical detection devices that cannot be performed, are complicated, and take a long time

Active Publication Date: 2008-12-17
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this item cannot be carried out with the existing optical detection device, or even if it can be carried out, it takes a lot of time and is accompanied by a complicated process

Method used

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  • Optical device testing apparatus and testing method
  • Optical device testing apparatus and testing method
  • Optical device testing apparatus and testing method

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Embodiment Construction

[0024] Hereinafter, the present invention will be described in detail with reference to the drawings.

[0025] Fig. 1 is a schematic diagram of an optical device detection device provided according to an embodiment of the present invention. part 50, photodiode 60, signal processing part 70, display part 80, and stand 90 for supporting the optical device 100.

[0026] The laser 10 is a light source that emits light to the optical device 100 , and the present invention uses a Zeeman laser (Zeeman laser) which is one form of a heterodyne laser. The heterodyne laser simultaneously emits two light beams whose polarization directions are perpendicular to each other and whose frequencies are different from each other. Although the frequencies of the two emitted lights are similar, they are not the same. In this embodiment, the wavelength of the first light (E1) is about 632.8nm, and the wavelength of the second light (E2) is about 632.5nm.

[0027] Figure 2a Indicates the polariz...

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Abstract

An apparatus and a method for inspecting an optical device are provided to measure the deformation of the optical device. An apparatus for inspecting an optical device includes a heterodyne laser(10), a phase changing section(30), a polarization section(40), a light collecting section(50), an optical diode(60), and a signal processing section(70). The heterodyne laser irradiates light to the optical device. The phase changing section removes noise by changing the phase of the light irradiated from the heterodyne laser. The polarization section polarizes the light passed through the optical device to a predetermined direction. The light collecting section collects the polarized light. The optical diode converts the collected light to an electrical signal. The signal processing section processes the electrical signal.

Description

technical field [0001] The invention relates to a detection device and a detection method of an optical device, in particular to a detection device and a detection method of an optical device that may produce birefringence and thickness deformation during the manufacturing process. Background technique [0002] Plate-like optical devices such as glass substrates used in liquid crystal display devices undergo various inspection processes during the manufacturing process. Such inspection items include air bubbles, scratches, point defects, contamination, attached impurities, etc. that occur inside and outside the optical device, and the quality of the optical device is evaluated and improved by measuring the items. [0003] The quality of this optical device is determined not only by the above-mentioned external factors, but also by internal factors such as the distribution of polarization degrees in the horizontal direction. As the display device is gradually enlarged, the i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G01N21/23G01N21/00
CPCG01B11/0608G01N21/23G01N21/6404G02F1/1313H01S3/1124H01S5/0623
Inventor 普特波夫·维拉帝莫赵成训李锡原李文九金洸秀
Owner SAMSUNG ELECTRONICS CO LTD