Large-scale virtual base for test instruments, and forming method

Abstract

A large-scale virtual test instrument library, comprising an input device (1) and an output device (2), is characterized in that it also includes an instrument library development system (4), a non-intelligent control library (5), a function library (6), an intelligent The control library (7) and the instrument library (8), the instrument library development system (4) is connected with each unit; the instrument library (8) each intelligent control instrument development platform (9) and the layer development platform (10) are independent of each other, and Connect with the instrument library development system (4) respectively. The characteristics of its formation method are: building the instrument library structure; building the non-intelligent control library (5), function library (6), intelligent control library (7) and instrument library (8); layering the instrument library (8), generating Intelligent control instrument development platform (9) and layer development platform (10). The notable effect of the invention is that it has an open system, can provide testing means and quality assurance for mechanical science research and mechanical products, and can meet testing requirements of different users.

Description

technical field [0001] The invention relates to the field of test instruments, in particular to a large-scale virtual test instrument library of a virtual test instrument and a forming method thereof. Background technique [0002] After searching, there are the following published patent documents related to virtual instruments: [0003] [1]Virtual instrumentation system and method for controlling a number ofinstruments, patent publication number: WO200159406-A, WO200159406-A1, AU200138113-A [0004] [2]A Virtualinstrument bus using network programming, patent classification number: G06F-003 / 02; G06F-003 / 14; G06F-003 / 147; G06F-015 / 403 [0005] In the past 10 years, due to the rapid and intensive penetration and expansion of information technology, mechanical testing technology and testing instruments have been deeply affected and severely challenged. New principles, new methods and new manufacturing processes in test systems are constantly emerging under the influence of i...

AI Technical Summary

Problems solved by technology

[0008] However, the disadvantage of the current virtual intelligent testing technology is that there is no new breakthrough in principle, so it is impossible for these resources to form a powerful technical resource that covers all disciplines and industries, and it is not enough to provide a full range of technical resources. system test method

One of the deep-seated reasons for the above situation is that the virtual intelligent test system has not established a unified model so far. Although functional software can mostly replace hardware components, it has not yet gotten rid of the manufacturing and calling form of hardware instrument stand-alone systems; although the functions of software have improved It improves the flexibility and openness of the instrument, but does not introduce the principles and methods of deep integration in manufacturing, so it is difficult to fundamentally change the current mode of virtual intelligent testing

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