Axis part diameter high precision rapid measuring device

Abstract

The high-precision and fast measuring device for the diameter of shaft parts is characterized by a pair of left-end movable bayonet and right-end movable bayonet that can slide toward each other along the diameter direction of the measured shaft to form a bayonet-type probe. Between the moving bayonets, a grating measuring device for measuring the relative sliding distance between the left end moving bayonet and the right end moving bayonet is installed. The grating measuring device is composed of a grating ruler and a grating head. The moving direction is set in parallel and is fixedly connected with the right-end movable bayonet, and the grating head arranged opposite is fixedly connected with the left-end movable bayonet. The invention can realize fast and accurate measurement of the diameter of shaft parts, and can directly display the measurement results on the computer screen to realize the functions of data storage and transmission; it can also calculate the shaft parts by processing and analyzing the measurement data Data information such as cylindricity and conicity.

Description

Technical field: [0001] The invention relates to a diameter detection device for shaft parts, more specifically, a high-precision and rapid diameter detection device for shaft parts that can be used in the fields of automobiles, aviation, aerospace, ships, machine tools, and CMM inspection. Background technique: [0002] At present, the commonly used diameter measurement methods are vernier calipers, micrometers, optical length measuring instruments, laser interferometers, dual-frequency laser interferometers, and tool microscopes. Vernier calipers and micrometers are used. Although this method conforms to Abbe’s principle, it is easily affected by human factors, and the measurement force is difficult to control. If the measurement force is not well controlled, the measurement results will drift and the repeatability will be poor; the use of optical length measuring instruments , laser interferometer, and dual-frequency laser interferometer have high measurement accuracy, bu...

AI Technical Summary

Problems solved by technology

Vernier calipers and micrometers are used. Although this method conforms to Abbe’s principle, it is easily affected by human factors, and the measurement force is difficult to control. If the measurement force is not well controlled, the measurement results will drift and the repeatability will be poor; the use of optical length measuring instruments , laser interferometer, and dual-frequency laser interferometer have high measurement accuracy, but it is very difficult to adjust each time, so the measurement efficiency is low; using a tool microscope, the measured piece can only be placed in it, and online measurement cannot be realized. Part size is limited

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