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Pulse shape measuring device and measuring method thereof

A technology of pulse shape and measuring device, applied in measuring device, pulse characteristic measurement, measuring distance and other directions, can solve the problems of heavy weight, large volume and high cost, and achieve the effect of high cost performance, high integration and light weight

Inactive Publication Date: 2007-09-12
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, the high-speed A / D sampling circuit is often expensive and generates a lot of heat, and some need to add a fan and an independent power supply, so it is bulky, difficult to integrate, and heavy, which limits its application in laser altimeters

Method used

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  • Pulse shape measuring device and measuring method thereof
  • Pulse shape measuring device and measuring method thereof
  • Pulse shape measuring device and measuring method thereof

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Embodiment Construction

[0037] The present invention will be further described below in conjunction with the accompanying drawings and a specific embodiment of the present invention. But it should not limit the protection scope of the present invention.

[0038] With reference to Fig. 2, Fig. 2 is the working principle diagram of pulse shape measurement of the present invention, in the present embodiment, N=3, the measurement of pulse shape is converted into the measurement of five time intervals, respectively is the pulse leading edge 10% peak voltage corresponding The time interval T1 between the moment and the moment corresponding to the 50% peak voltage of the pulse leading edge, the time interval T2 between the moment corresponding to the 10% peak voltage of the pulse leading edge and the moment corresponding to the 90% peak voltage of the pulse leading edge, and the 10% peak voltage of the pulse leading edge The time interval T3 between the corresponding moment and the moment corresponding to t...

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Abstract

This invention relates to a measuring method and device of impulse form. The invention includes one constant proportion timing discriminate module and one time-to-digital conversion module. Data of time-to-digital conversion modular enter calculator for handling. Constant proportion timing discriminate module has a group of leading edge discriminator and a group of back edge discriminator, which separately discriminate a series of points where the ratio of pulse front edge and back edge voltage and spike voltage are certain worth corresponding time. multipass time-to-digital conversion module convert time interval between first time and subsequently time to digital quantity, adopt digital counting method and combine digital delay line bracketing method, realize at a piece of field programmable logic array FPGA. sending obtained data into computer for calculation to gain time interval, base on voltage peak ratio of every time to indirectly reduce impulse form, and obtain pulsewidth. The invention has low cost, small bulk, and light weight, can apply to laser range finder.

Description

technical field [0001] The invention relates to a laser pulse shape, in particular to a pulse shape measuring device and a measuring method. Background technique [0002] Laser rangefinders obtain distance information by measuring the flight time of laser pulses. At the same time, after the emitted laser pulse interacts with the target surface, the echo pulse will often be broadened or deformed due to the difference in target surface characteristics (such as roughness, inclination, etc.). Therefore, by obtaining the shape of the echo pulse, And the echo pulse width can be obtained from this, and the basic characteristics of the target can be obtained indirectly. [0003] In the laser altimeter system, the existing pulse shape measurement technology generally adopts A / D sampling circuit, and the working principle is shown in Figure 1. At a series of selected moments, the amplitude (voltage) of the input pulse is sampled, and the hold time enters after the sampling is over. ...

Claims

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Application Information

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IPC IPC(8): G01R29/02G01J11/00G01C3/00
Inventor 雷琳君陈卫标杨燕
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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