Electric power pulling bias testing device and testing method thereof

Abstract

The invention discloses a power supply bias test device, comprising an adjustable power supply, a power on sequence control circuit and a switch element, wherein the adjustable power supply connected with the switch element is used to supply the electricity for the switch element; the power on sequence control circuit is used to output switch signals to the switch element, the switch signals generated according to the set power on sequence are used to control the opening of the switch element; the adjustable power supply outputs the bias power supply by the switch element which is used to realize the bias of the power supply which needs the bias. The invention also discloses a power supply bias test method. Compared with prior art, by the simple method, the invention realizes the bias of the power supply in a system, of which the power on sequence requirement is needed, thereby reducing the complexity of the system and improving the maneuverability.

Description

technical field [0001] The invention relates to a semiconductor integrated circuit testing technology, in particular to a power supply bias testing device and a testing method thereof. Background technique [0002] With the development of semiconductor integrated circuits, the integration of electronic equipment is getting higher and higher, and the requirements for testing technology are also getting higher and higher. Among them, the power supply bias test often uses a test method. [0003] In some mainboard test systems, it is necessary to perform a power bias test when testing key components. Control, one method is to use the main control server to control the power supply voltage and power-on and power-on sequence. This system is more complicated, and this system also regards the main board as a whole, and does not pull the power supply inside the main board. [0004] Some tests need to pull the bias of the internal power supply of the board. One method is to control t...

AI Technical Summary

Problems solved by technology

[0006] Chinese patents No. 02131007 and No. 03137017 have the following deficiencies: These two patents both propose to use the main controller to control the power-on sequence and amplitude system of the bias power supply, which is relatively complicated, and it does not involve the bias pull of the internal power supply of the motherboard.

[0007] The Chinese patent No. 03206587 has the following disadvantages: in this patent, it is proposed to control the output current of the power supply module with switches of multiple field effect transistors, thereby controlling the output voltage of the power supply, and finally realizing the pull-bias of the power supply. The bias pull is carried out when the module exists. This bias pull method can only realize the step pull bias of the voltage, and cannot be adjusted steplessly. The range of voltage adjustment is also limited. It is suitable for the integration test of the component power supply of the computer integration manufacturer, but in Not suitable for some tests that require stepless voltage regulation with a wide adjustment range

[0008] The Japanese patent No. 05002502A has the following deficiencies: the patent provides a test scheme for automatically testing the boundary operating voltage, which can realize automatic testing and recording, but for systems with multiple power supplies and power-on sequence requirements, how to pull the bias not involved

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