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Application of non-ionic polyalcohol in producing and using self-stopping polysilicon polishing solution

A technology of polymer and polishing liquid, applied in grinding/polishing equipment, machine tool for surface polishing, polishing composition, etc., can solve the problems of shortening polishing time and cost, polysilicon dish-shaped concave loss, limited polishing effect, etc. Effects of no polysilicon residue, lower production costs, and higher productivity

Inactive Publication Date: 2008-06-11
ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the polishing process of polysilicon, there are usually the following two problems: 1. Because the polishing rate selection ratio of polysilicon / silicon dioxide is too high, when the final polishing process stops on the silicon dioxide layer, it is inevitable that there will be polysilicon discs. shape denting
Although the above technologies have achieved a certain planarization effect to a certain extent and shortened the polishing time and cost, they are either operated in two steps, or only suppress the polishing rate of polysilicon, and the operation is complicated and the polishing effect is limited.

Method used

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  • Application of non-ionic polyalcohol in producing and using self-stopping polysilicon polishing solution
  • Application of non-ionic polyalcohol in producing and using self-stopping polysilicon polishing solution
  • Application of non-ionic polyalcohol in producing and using self-stopping polysilicon polishing solution

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1~16

[0025] Embodiments 1-16 are used for the preparation of polysilicon chemical mechanical polishing fluid capable of realizing self-stopping mechanism

[0026] A polymer containing -(RO)- or -(RCOO)-group (R is an alkyl group with 1 to 10 carbon atoms) in the repeating unit is used to prepare a chemical mechanical polishing liquid for polysilicon that can realize a self-stopping mechanism, Table 1 shows the composition formula of the polishing liquid prepared in Examples 1-16, wherein water is the balance.

[0027] Table 1 The chemical mechanical polishing fluid for polysilicon that can realize the self-stop mechanism prepared in Examples 1 to 16

[0028]

Embodiment 17

[0029] Embodiment 17 is used for the use of the polysilicon chemical mechanical polishing liquid that can realize self-stop mechanism

[0030]The polishing solution prepared according to the formula of Example 1 is dropped on the PPG fast pad polishing pad, the wafer face is down, contacts the polishing pad surface, rotates the polishing pad and the polishing head respectively with the rotating speed of 147rpm and 150rpm, while being polished The backside of the wafer is polished with a down force of 1 psi. The flow rate of the polishing liquid is 100ml / min, and the time is 3 minutes.

Embodiment 18

[0031] Embodiment 18 is used for the use of the polysilicon chemical mechanical polishing liquid that can realize self-stop mechanism

[0032] The polishing solution prepared according to the formula of Example 2 is dropped on the IC1010 polishing pad, the wafer is facing downwards, contacts the surface of the polishing pad, rotates the polishing pad and the polishing head respectively with the rotating speed of 147rpm and 150rpm, and simultaneously polishes the wafer backside Apply 3psi of downforce to polish. The flow rate of the polishing liquid is 100ml / min, and the time is 2 minutes.

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Abstract

The invention discloses preparation of polymer including -(RO)- or -(RCOO)-groups in a repeating unit in polysilicon chemical mechanical polishing solution which can realize automatic stopping mechanism, and the application during the operation process of the polymer, wherein, the R is alkyl with 1 to 10 carbon atom(s). The polymer of the invention is used for the preparation of polishing solution and the use of the polishing solution, and can realize the polysilicon chemical mechanical polishing process under the fixed and conventional process parameter polishing condition, thus avoiding the generation of polysilicon dish shaped dent default in a silicon dioxide channel, removing the polysilicon residual in the polysilicon dish shaped dent default, and enhancing the smoothness of a wafer surface after being polished. The polymer has the advantage that the process window is wide, thereby the production efficiency is greatly improved, and the production cost is reduced greatly.

Description

technical field [0001] The present invention relates to the application of polymers containing -(RO)- or -(RCOO)-groups in repeating units in the preparation and use of polysilicon chemical mechanical polishing fluids capable of realizing a self-stopping mechanism, wherein R is the number of carbon atoms It is an alkyl group of 1-10. Background technique [0002] In the polishing process of polysilicon, there are usually the following two problems: 1. Because the polishing rate selection ratio of polysilicon / silicon dioxide is too high, when the final polishing process stops on the silicon dioxide layer, it is inevitable that there will be polysilicon discs. Shape concave. Such as figure 1 As shown, a and b in the figure are the structures before and after polishing, respectively. And this problem will be exacerbated with the increase of the trench width between silicon dioxide. This can severely impact device performance. 2. During the shallow trench isolation (STI) ch...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09G1/16C09G1/02B24B29/00
CPCC09G1/02H01L21/32133
Inventor 杨春晓荆建芬王麟
Owner ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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